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X. Meng
Researcher at University of California, Berkeley
Publications - 2
Citations - 36
X. Meng is an academic researcher from University of California, Berkeley. The author has contributed to research in topics: Electron beam-induced deposition & High-resolution transmission electron microscopy. The author has an hindex of 1, co-authored 1 publications receiving 33 citations.
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Imaging of soft and hard materials using a Boersch phase plate in a transmission electron microscope
Damien Alloyeau,W.K. Hsieh,E Anderson,L. Hilken,Gerd Benner,X. Meng,Fu-Rong Chen,Christian Kisielowski +7 more
TL;DR: Using two levels of electron beam lithography, vapor phase deposition techniques, and FIB etching, an electrostatic Boersch phase plate was fabricated for contrast enhancement of weak phase objects in a transmission electron microscope.