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X. X. Ran

Researcher at Wuhan University of Technology

Publications -  2
Citations -  49

X. X. Ran is an academic researcher from Wuhan University of Technology. The author has contributed to research in topics: Digital image correlation & Beamline. The author has an hindex of 2, co-authored 2 publications receiving 42 citations.

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Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation.

TL;DR: XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation, and is demonstrated to be feasible for dynamic strain field mapping.
Journal ArticleDOI

Nucleation and growth of damage in polycrystalline aluminum under dynamic tensile loading

TL;DR: In this paper, plate-impact experiments were conducted to study the features and mechanisms of void nucleation and growth in the polycrystalline of pure aluminum under dynamic loading, and it was found that most of the void nucleations in grains neared the boundaries of weak-orientation grains and grew toward the grain boundaries with fractured small grains around the boundaries.