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X. X. Ran
Researcher at Wuhan University of Technology
Publications - 2
Citations - 49
X. X. Ran is an academic researcher from Wuhan University of Technology. The author has contributed to research in topics: Digital image correlation & Beamline. The author has an hindex of 2, co-authored 2 publications receiving 42 citations.
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Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation.
L. Lu,D. Fan,B. X. Bie,X. X. Ran,M. L. Qi,Niranjan D. Parab,Jianzhuo Sun,Hangjie Liao,Matthew Hudspeth,Benjamin Claus,Kamel Fezzaa,Tao Sun,Weinong Chen,Xinglong Gong,Sheng-Nian Luo +14 more
TL;DR: XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation, and is demonstrated to be feasible for dynamic strain field mapping.
Journal ArticleDOI
Nucleation and growth of damage in polycrystalline aluminum under dynamic tensile loading
TL;DR: In this paper, plate-impact experiments were conducted to study the features and mechanisms of void nucleation and growth in the polycrystalline of pure aluminum under dynamic loading, and it was found that most of the void nucleations in grains neared the boundaries of weak-orientation grains and grew toward the grain boundaries with fractured small grains around the boundaries.