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Xavier Llovet

Researcher at University of Barcelona

Publications -  107
Citations -  1689

Xavier Llovet is an academic researcher from University of Barcelona. The author has contributed to research in topics: Monte Carlo method & Ionization. The author has an hindex of 23, co-authored 102 publications receiving 1472 citations.

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Cross Sections for Inner-Shell Ionization by Electron Impact

TL;DR: In this paper, an analysis is presented of measured and calculated cross sections for inner-shell ionization by electron impact, and the essentials of classical and semiclassical models and quantum approximations for computing ionization cross sections.
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Monte Carlo simulation of bremsstrahlung emission by electrons

TL;DR: In this paper, an algorithm for the simulation of bremsstrahlung emission by fast electrons using numerical cross sections is described, based on natural factorization of the double-differential cross section and on the fact that the intrinsic angular distribution of photons with a given energy can be very closely approximated by a Lorentz-boosted dipole distribution.
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Monte Carlo simulation of bremsstrahlung emission by electrons

TL;DR: In this article, the basic components of Monte Carlo simulation of bremsstrahlung emission by electrons are presented and various theoretical cross-sections that have been used in Monte Carlo codes are described.
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Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons

TL;DR: In this article, a general algorithm for the simulation of x-ray spectra emitted from targets of arbitrary composition bombarded with kilovolt electron beams is presented, in which the energy of emitted photons is sampled from numerical cross-section tables, while the angular distribution of the photons is represented by an analytical expression with parameters determined by fitting benchmark shape functions obtained from partial wave calculations.
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Correction of secondary X-ray fluorescence near grain boundaries in electron microprobe analysis: Application to thermobarometry of spinel lherzolites

TL;DR: In this article, a correction procedure is proposed to account for the effect of secondary X-ray fluorescence near grain boundaries in electron microprobe analysis, based on the Monte Carlo simulation method, which is used to calculate the Xray spectrum emitted by the mineral couple (i.e., the mineral of interest with the neighboring mineral).