There is a special reason for reviewing this book at this time: it is the 50th edition of a compendium that is known and used frequently in most chemical and physical laboratories in many parts of the world. Surely, a publication that has been published for 56 years, withstanding the vagaries of science in this century, must have had something to offer. There is another reason: while the book is a standard fixture in most chemical and physical laboratories, including those in medical centers, it is not as frequently seen in the laboratories of physician's offices (those either in solo or group practice). I believe that the Handbook can be useful in those laboratories. One of the reasons, among others, is that the various basic items of information it offers may be helpful in new tests, either physical or chemical, which are continuously being published. The basic information may relate

Handbook of Chemistry and Physics

This paper presents a new reflectance model for rendering computer synthesized images. The model accounts for the relative brightness of different materials and light sources in the same scene. It describes the directional distribution of the reflected light and a color shift that occurs as the reflectance changes with incidence angle. The paper presents a method for obtaining the spectral energy distribution of the light reflected from an object made of a specific real material and discusses a procedure for accurately reproducing the color associated with the spectral energy distribution. The model is applied to the simulation of a metal and a plastic.

A reflectance model for computer graphics

We present a general and practical method for computing BSDFs of layered materials. Its ingredients are transport-theoretical models of isotropic or anisotropic scattering layers and smooth or rough boundaries of conductors and dielectrics. Following expansion into a directional basis that supports arbitrary composition, we are able to efficiently and accurately synthesize BSDFs for a great variety of layered structures. Reflectance models created by our system correctly account for multiple scattering within and between layers, and in the context of a rendering system they are efficient to evaluate and support texturing and exact importance sampling. Although our approach essentially involves tabulating reflectance functions in a Fourier basis, the generated models are compact to store due to the inherent sparsity of our representation, and are accurate even for narrowly peaked functions. While methods for rendering general layered surfaces have been investigated in the past, ours is the first system that supports arbitrary layer structures while remaining both efficient and accurate. We validate our model by comparing to measurements of real-world examples of layered materials, and we demonstrate an interactive visual design tool that enables easy exploration of the space of layered materials. We provide a fully practical, high-performance implementation in an open-source rendering system.

A comprehensive framework for rendering layered materials

We present an algorithm to render objects of transparent materials with rough surfaces in real-time, under distant illumination. Rough surfaces cause wide scattering as light enters and exits objects, which significantly complexifies the rendering of such materials. We present two contributions to approximate the successive scattering events at interfaces, due to rough refraction: First, an approximation of the bidirectional scattering function (BSDF = BRDF + BTDF), using spherical Gaussians, suitable for real-time estimation of environment lighting using pre-convolution; second, a combination of cone tracing and macro-geometry filtering to efficiently integrate the scattered rays at the exiting interface of the object. We demonstrate the quality of our approximation by comparison against stochastic raytracing.

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Real-time rough refraction

We derive a novel framework for the efficient analysis and computation of light transport within layered materials. Our derivation consists in two steps. First, we decompose light transport into a set of atomic operators that act on its directional statistics. Specifically, our operators consist of reflection, refraction, scattering, and absorption, whose combinations are sufficient to describe the statistics of light scattering multiple times within layered structures. We show that the first three directional moments (energy, mean and variance) already provide an accurate summary. Second, we extend the adding-doubling method to support arbitrary combinations of such operators efficiently. During shading, we map the directional moments to BSDF lobes. We validate that the resulting BSDF closely matches the ground truth in a lightweight and efficient form. Unlike previous methods we support an arbitrary number of textured layers, and demonstrate a practical and accurate rendering of layered materials with both an offline and real-time implementation that are free from per-material precomputation.

/pdf/efficient-rendering-of-layered-materials-using-an-atomic-3f7gyu5ias.pdf

Efficient rendering of layered materials using an atomic decomposition with statistical operators

We present a new model, called the dual-microfacet, for those materials such as paper and plastic formed by a thin, transparent slab lying between two surfaces of spatially varying roughness. Light transmission through the slab is represented by a microfacet-based BTDF which tabulates the microfacet's normal distribution (NDF) as a function of surface location. Though the material is bounded by two surfaces of different roughness, we approximate light transmission through it by a virtual slab determined by a single spatially-varying NDF. This enables efficient capturing of spatially variant transparent slices. We describe a device for measuring this model over a flat sample by shining light from a CRT behind it and capturing a sequence of images from a single view. Our method captures both angular and spatial variation in the BTDF and provides a good match to measured materials.

The Dual‐microfacet Model for Capturing Thin Transparent Slabs

We present a sketch-based approach to find matching source images for seamless image composition, by leveraging a large amount of image corpus collected from the Internet. Given a target image where the user draws a rough sketch to indicate the desired object fill-in, our system automatically searches a large image database, and returns a sparse set of matching images. These matching images contain salient regions semantically similar to the usersupplied sketch. Once the user has selected the preferred source region, it will be seamlessly pasted onto the target image where the sketch is drawn.

/pdf/sketch-and-match-scene-montage-using-a-huge-image-collection-39rb4m20ii.pdf

Yiming Liu

Papers

The Dual‐microfacet Model for Capturing Thin Transparent Slabs

Sketch and Match: Scene Montage Using a Huge Image Collection