Z
Zhiming Huang
Researcher at Chinese Academy of Sciences
Publications - 104
Citations - 1510
Zhiming Huang is an academic researcher from Chinese Academy of Sciences. The author has contributed to research in topics: Thin film & Terahertz radiation. The author has an hindex of 18, co-authored 94 publications receiving 1072 citations. Previous affiliations of Zhiming Huang include Nanyang Technological University.
Papers
More filters
Journal ArticleDOI
Photodetectors of 2D Materials from Ultraviolet to Terahertz Waves
Qinxi Qiu,Zhiming Huang +1 more
TL;DR: In this paper, the authors reviewed the recent progress on 2D material photodetectors, covering the spectrum from ultraviolet to terahertz waves, and proposed defect engineering, p-n junctions and hybrid detectors.
Journal ArticleDOI
High performance of Mn-Co-Ni-O spinel nanofilms sputtered from acetate precursors
TL;DR: It is reported that high quality of MCN nanofilms can be achieved by sputtering deposition via acetate precursors whose decomposition temperatures are matched to the initial synthesis temperature of the MCN thin films.
Journal ArticleDOI
Characterization of Mn1.56Co0.96Ni0.48O4 films for infrared detection
TL;DR: In this article, the properties of the Mn1.56Co0.96Ni0.48O4 spinel structures were studied by atomic force microscope and field-emission scanning electron microscope, and the conduction was described by a variable range hopping model for a parabolic density of states.
Journal ArticleDOI
Highly sensitive phototransistor based on GaSe nanosheets
Hai Huang,Peng Wang,Yanqing Gao,Xudong Wang,Tie Lin,Jianlu Wang,Lei Liao,Jinglan Sun,Xiangjian Meng,Zhiming Huang,Xiaoshuang Chen,Junhao Chu +11 more
TL;DR: In this article, the ultrathin GaSe nanosheets were exfoliated from commercially available crystals using a micromechanical cleavage technique and used to fabricate field effect transistors on Si/SiO2 substrates with interdigitated electrodes.
Journal ArticleDOI
Optical properties of PbZrxTi1−xO3 on platinized silicon by infrared spectroscopic ellipsometry
TL;DR: In this paper, a method of analyzing infrared spectroscopic ellipsometry (IRSE) measurement data is proposed for lead zirconate titanate PbZrxTi1−xO3 (PZT) thin films grown on Pt/Ti/SiO2/Si substrates with x=0.3 and 0.5.