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All figures (10)
Figure 5. Linearity slope change with stress time.
Figure 6. Dark rate slope change with stress time.
Figure 7. Pixel response during FPN measurement at 27°C.
Figure 4. Linearity changes with stress time, black symbols indicate time zero, white symbols indicate at the end of stress.
Figure 2. Schematic of the accelerated testing set-up.
Figure 3. Stress matrix for the accelerated testing.
Figure 11. Image with pixel degradation (Median percentage change is 20%).
Figure 8. Original image of Saturn
Figure 10. Image with pixel degradation (Median percentage change is 15%).
Figure 9. Image with pixel degradation (Median percentage change is 10%).
Proceedings Article
•
DOI
•
A chip and pixel qualification methodology on imaging sensors
[...]
Yuan Chen
1
,
Steven M. Guertin
1
,
M. Petkov
1
,
D.N. Nguyen
1
,
F. Novak
2
- Show less
+1 more
•
Institutions (2)
California Institute of Technology
1
,
Langley Research Center
2
25 Apr 2004
-