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Analysis of superconducting thin films in a modern FIB/SEM dual-beam instrument

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This article is published in Microscopy and Microanalysis.The article was published on 2021-08-01 and is currently open access. It has received 0 citations till now.

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Journal ArticleDOI

Materials design for artificial pinning centres in superconductor PLD coated conductors

TL;DR: In this article, a collaborative project EUROTAPESPES, which was funded by the European Commission's Seventh Framework Program under Grant Agreement No. 280432, was proposed.
Journal ArticleDOI

Superconductive REBCO Thin Films and Their Nanocomposites: The Role of Rare-Earth Oxides in Promoting Sustainable Energy

TL;DR: In this article, the effect of controlled incorporation of APCs through various methods and techniques on the superconducting properties of YBa2Cu3O7- (YBCO) and REBCO thin films is presented.
Journal ArticleDOI

Why Principal Component Analysis of STEM spectrum-images results in "abstract", uninterpretable loadings?

TL;DR: This work investigates the potential reasons for appearing such counterintuitive PCA outputs and identifies the following reasons: complexity of data variations inconsistent with the orthogonality restrictions of PCA, non-linearity caused either by chemical variations or by the peculiarities of the spectra formation.
Journal ArticleDOI

Probing localized strain in solution-derived YB a 2 C u 3 O 7 -δ nanocomposite thin films

TL;DR: In this article, the authors acknowledge financial support from Spanish Ministry of Economy and Competitiveness through the “Severo======Ochoa” Programme for Centres of Excellence in R&D.
Journal ArticleDOI

Versatile application of a modern scanning electron microscope for materials characterization

TL;DR: In this paper, the authors use a modern scanning electron microscope, which is equipped with in-lens and in-column detectors, a double-tilt holder for electron transparent specimens and a CCD camera for the acquisition of on-axis diffraction patterns.
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