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Journal ArticleDOI

Current Profile Monitor for Use in Scanning Electron Beam Irradiations

Shigeru Okabe, +2 more
- 01 Nov 1970 - 
- Vol. 41, Iss: 11, pp 1537-1539
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TLDR
In this paper, a current profile monitor for the scanning electron beam from the accelerator is described, which utilizes the fact that the electrons scattered through large angles by the exit window of the scanner show a profile similar to that of the main beam at the irradiation site.
Abstract
A current profile monitor for the scanning electron beam from the accelerator is described. It utilizes the fact that the electrons scattered through large angles by the exit window of the scanner show a profile similar to that of the main beam at the irradiation site. The scattered electrons are collected by small probes arranged in a linear array parallel to the scanning direction, and the beam profile in this direction is displayed by a storage oscilloscope or an X‐Y recorder. This device has been used for electrons of energies 4–16 MeV from a linear accelerator and proved to be useful for continual monitoring with negligible disturbance to the irradiation in progress.

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Citations
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Journal ArticleDOI

Design considerations for a beam scanner at the university of Manitoba Cyclotron facility

TL;DR: In this article, the authors describe the development of a beam scanner for the University of Manitoba Cyclotron, which gives an output on an oscilloscope of the beam profile, a "cross sectional" view of the intensity of the charged particle beam and its position.
References
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Journal ArticleDOI

Handbuch der Physik

M. De
Journal ArticleDOI

Measurement of multiple scattering of 15.7-mev electrons

TL;DR: In this article, the angular distribution of electrons scattered by thin Be and Au foils has been measured for angles where the multiple scattering is important, and the 1e widths of the distributions obtained with 18.66 and 37.28 mg/cm2 are 2.58° and 3.76°, respectively.
Journal ArticleDOI

Beam Profile Measurement for Electron Accelerators

TL;DR: In this article, the beam profile of electron accelerators is monitored using the secondary emission from the probe and the partial absorption of the primary beam in it, respectively, and the probe consists of cooper wire or thin aluminum plate.
Journal ArticleDOI

Use of polymethyl methacrylate plates for electron beam measurements at energies above 1 MeV

TL;DR: In this article, the optical density of clear polymethyl methacrylate 1 8 in. thick exposed to an electron beam has been measured with an ordinary photographic densitometer.
Journal ArticleDOI

Beam Profile Monitor for Linear Electron Accelerator

TL;DR: In this article, the use of a lead sulfide detector in a device for monitoring the intensity distribution of high energy electron beams from a linear accelerator is described, and experimental measurements of the beam profile for a 6-MeV linear accelerator are presented.
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