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Journal ArticleDOI

Decorrelation-induced phase errors in phase-shifting speckle interferometry.

Mathias Lehmann
- 01 Jun 1997 - 
- Vol. 36, Iss: 16, pp 3657-3667
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TLDR
The purpose of this research is the quantitative investigation of decorrelation-induced phase errors in speckle interferometry, and the number of speckles per pixel does not affect the phase error distribution over the whole image.
Abstract
The purpose of this research is the quantitative investigation of decorrelation-induced phase errors in speckle interferometry. Measurements in speckle interferometry are inherently affected by decorrelation, i.e., by alterations of the speckle fields during measurement. Likewise, the random phases carrying the interferometric information change during decorrelation. Image plane and pupil plane decorrelation are considered for both smooth and speckle reference wave interferometers. Since the decorrelation effect depends on the aperture and the pixel size, the calculations include not only the case of speckles being well resolved by the camera but also the case of unresolved speckles. Different standard deviations of the phase error are obtained from the probability density of the pixel modulation and the phase before and after decorrelation. Most cases (apart from pupil plane decorrelation in speckle reference wave setups) appear to obey exactly the same phase error statistics. In particular, the number of speckles per pixel does not affect the phase error distribution over the whole image. The only important parameters determining the decorrelation-induced phase errors are the amount of decorrelation and the pixel modulation.

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Citations
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Journal ArticleDOI

Digital evaluation of interferograms

TL;DR: In this article, the authors describe the methods used and focus on their implementation in such a universal software, which focuses on high-resolution digital fringe evaluation including phase stepping, Fourier domain evaluation as well as unwrapping techniques for regular and irregular fringe patterns.
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Automated fringe pattern analysis in experimental mechanics: A review

TL;DR: The main numerical techniques that have been developed to carry out fully automated analysis of fringe patterns resulting from solid mechanics experiments are reviewed, and a unified treatment for both speckle and smooth-wavefront interferograms is presented.
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Speckle Interferometry: A Review of the Principal Methods in Use for Experimental Mechanics Applications

TL;DR: The speckle interferometry (SI) has become a complete technique, widely used in many branches of experimental mechanics as mentioned in this paper and its principal characteristics from both theoretical and practical points of view.
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Recent developments and applications in electronic speckle pattern interferometry

TL;DR: Electronic speckle pattern interferometry (ESPI) is a whole-field non-contact optical metrology technique for displacement measurement, based on the optical physics of surface-generated laser specckle as mentioned in this paper.
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Quality assessment of combined quantization-shot-noise-induced decorrelation noise in high-speed digital holographic metrology

TL;DR: A criterion based on the coherence factor of the hologram phase difference is proposed, which leads to define the optimal conditions for recording at very-high frame rate with minimization of the decorrelation noise.
References
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Journal ArticleDOI

Speckle-pattern intensity and phase: Second-order conditional statistics

TL;DR: In this paper, the second-order conditional statistics of speckle patterns were analyzed under the assumption of Gaussian field components, and the conditional distributions and moments of intensity and phase for a joint measurement performed in the presence of partial correlation were derived.
Journal ArticleDOI

Least-squares fitting of the phase map obtained in phase-shifting electronic speckle pattern interferometry.

TL;DR: A new method has been developed to remove noise from the deformation phase map obtained by a phase-shifting electronic speckle pattern interferometry, which estimates almost noise-free phase values directly from the distributions of the intensity differences of four interference patterns by a least-squares fit.
Journal ArticleDOI

Phase-shifting speckle interferometry with unresolved speckles: A theoretical investigation

TL;DR: In this article, the statistical distribution of the background intensity and the modulation is derived for an arbitrary number n of speckles per pixel, for both the speckle and the smooth reference wave setup.
Journal ArticleDOI

Statistical properties of ray directions in a monochromatic speckle pattern

TL;DR: In this paper, the statistical properties of the spatial derivatives of the phase of a monochromatic speckle pattern are studied and a two-dimensional probability density function is derived that depends on the two first and three second spatial moments of the illumination intensity distribution of the scattering object.
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