Patent
High-resolution fourier interferometer-spectrophotopolarimeter
TLDR
In this article, a high-resolution Fourier interferometer-spectrophotopolarimeter is provided using a single linear polarizer-analyzer the transmission axis azimuth of which is positioned successively in the three orientations of 0°, 45°, and 90°, in front of a detector.Abstract:
A high-resolution Fourier interferometer-spectrophotopolarimeter is provided using (i) a single linear polarizer-analyzer the transmission axis azimuth of which is positioned successively in the three orientations of 0°, 45°, and 90°, in front of a detector; (ii) four flat mirrors, three of which are switchable to either of two positions to direct an incoming beam from an interferometer to the polarizer-analyzer (1) around a sample cell (2) transmitted through a medium in a cell and (3) reflected by medium in the cell; and (iii) four fixed focussing lenses, all located in a sample chamber attached at the exit side of the interferometer. This arrangement can provide the distribution of energy and complete polarization state across the spectrum of (a) the reference light entering from the interferometer; (b) the same light after a fixed-angle reflection from the sample cell containing a medium to be analyzed; and (c) the same light after direct transmission through the same sample cell, with the spectral resolution provided by the interferometer.read more
Citations
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References
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PatentDOI
Single mirror normal incidence reflectometer
TL;DR: In this paper, a single beam reflectometer adaptable for use with commercial monochromators and employing a vacuum chamber which houses a mirror pivotable to either one of two positions.
Patent
Semi-micro absolute transmittance and specular reflectance accessory for spectrophotometers
TL;DR: In this article, the authors propose an improved accessory for spectrophotometers having a plurality of reflecting means some of which are fixed and others exactly repositionable; all of such reflecting means are mounted upon a platform which can be kinematically positioned intermediate to a monochromatic light source and measuring means so that the monochrome beam is reflected toward a semi-micro sample, which may be held in a cryostat, permitting the determination of absolute transmittance and reflectance over a wide range of temperatures.