High resolution threshold and pulsed field ionization photoelectron spectroscopy using multi-bunch synchrotron radiation

TLDR: In this article, a steradiancy-type zero kinetic energy photoelectron (ZEKE-PE) analyzer and the high resolution monochromatized vacuum ultraviolet (VUV) undulator synchrotron radiation of the chemical dynamics beamline at the advanced light source (ALS) were used to filter prompt electrons and by employing a proper voltage pulsing scheme adapted to the timing structure of the ALS, they achieved a resolution of 0.5 meV (FWHM).

Abstract: We have demonstrated a resolution of 0.8 meV [full width at half-maximum (FWHM)] for threshold photoelectron measurements using a steradiancy-type zero kinetic energy photoelectron (ZEKE-PE) analyzer and the high resolution monochromatized vacuum ultraviolet (VUV) undulator synchrotron radiation of the chemical dynamics beamline at the advanced light source (ALS). Using this high resolution ZEKE-PE energy analyzer to filter prompt electrons and by employing a proper voltage pulsing scheme adapted to the timing structure of the ALS, we have achieved a resolution of 0.5 meV (FWHM) for pulsed field ionization photoelectron (PFI-PE) measurements with little contamination from prompt photoelectrons produced from direct photoionization and autoionizing processes. The experiment scheme presented here is generally applicable to PFI-PE studies using multi-bunch VUV synchrotron radiation at other synchrotron radiation facilities.