Patent
Method and apparatus for assessing surface roughness
Van-Minh Huynh,Francis M. Luk +1 more
TLDR
In this article, a relatively low cost processor based optical system is used to carry out the method, where an area of the surface whose roughness is to be assessed is illuminated by a light source, and a reflected light is directed to the lens of the video camera.Abstract:
A relatively low cost processor based optical system is used to carry out the method. An area of the surface whose roughness is to be assessed is illuminated by a light source, and a reflected light is directed to the lens of the video camera. The analog output of the video camera is digitized, and the digital signal is provided to a processor which performs an analysis to provide a parameter indicative of the roughness of the surface.read more
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Patent
Surface defect inspection apparatus
TL;DR: A surface defect inspection apparatus is a lighting unit shaped in an arched form laid across the path of movement of an object under inspection for illuminating its surface as mentioned in this paper, where a light diffusion sheet is located between the lighting unit and the path for forming a bright and dark light pattern on the surface of the object.
Patent
Visual inspection method and apparatus therefor
Yukio Matsuyama,Yuji Takagi,Takashi Hiroi,Maki Tanaka,Asahiro Kuni,Junzou Azuma,Shunji Maeda,Chie Shishido +7 more
TL;DR: In this paper, the brightness values of a pattern, which should be essentially the same, contained in two detected images to be compared are corrected in such a manner that, even if there may be a brightness difference in a portion free from defects, the brightness difference is reduced to such a degree so that it can be recognized as a normal portion.
Patent
Computer controlled, multiple angle illumination system
Vincent C. Conzola,Norman E. Rittenhouse,Jeffrey M. Solomon,Thomas J. Toomey,Peter J. Yablonsky +4 more
TL;DR: In this paper, the authors present an illumination system as a part of an optical inspection system, the total inspection system itself, and the method of illuminating and inspecting a workpiece.
Patent
Image processing apparatus and method of processing height data to obtain image data using gradient data calculated for a plurality of different points of a surface and adjusted in accordance with a selected angle of illumination
TL;DR: An apparatus and method for the processing of height information indicative of the roughness or texture of a surface which may be used to produce an improved two dimensional recording of the surface is described in this article.
Patent
High resolution ultrasonic coating thickness gauge
TL;DR: In this paper, the authors present a measurement system for determining the thickness of a polyurethane coating on a substrate, which includes a pulser for sending pulses to the transducer to trigger the emission of the ultrasonic signals.
References
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Patent
Electro-optical part inspection in the presence of contamination and surface finish variation
TL;DR: In this paper, a light image of pattern is imaged onto a photodetector corresponding to each of a plurality of points or zones on the surface of an object illuminated with light so that the photoder produces an electrical output signal related to the relative location of the individual points or regions.
Patent
Method and apparatus for automatic quantitative measurement of textures by image analysis
TL;DR: In this article, a method and an apparatus for automatic quantitative measurement of textures by image analysis for measuring textures of a material containing various optically anisotropic textures is presented, where image patterns of the textures are recognized on the basis of gray level variations observed before and after a mask movement, and the textures of the material are determined according to predetermined criteria.
Patent
Device for the logical analysis of textures
TL;DR: In this article, the authors present an approach for the analysis of heterogeneous textures which forms an electrical image of a medium by such means as a television camera for line-by-line scanning of an image of said medium which is obtained by suitable means such as a microscope.
Patent
Automatic surface inspection system
Kobayashi Yuuji,Okada Takao +1 more
TL;DR: In this article, a surface inspection system includes a surface scanner for scanning the inner surface of a paper cup rotated about its own axis and a preprocessing section receiving a picture element signal from the surface scanner.
Patent
Microfinish measurement apparatus and technique
Gary P. Weltlich,Gary G. Wagner +1 more
TL;DR: In this paper, an apparatus and technique for measuring microfinishes of workpieces at on-line speeds is presented, and a digitized image of a finished surface of a workpiece is generated under microprocessor control.