Multiple criterion optimization with statistical consideration

TLDR: A new method for estimating yield and the gradient of yield is developed based upon a combination of the Simplicial Approximation technique of Director and Hachtel and the yield estimation procedure of Bandler and Abdel-Malek.

Abstract: A number of recent papers have described circuit optimization methods y in which maximizing yield was the sole design criterion. However, in actual practice there are many competing design criterion such as minimizing power, y maximizing speed, area, etc., as well as maximizing yield. In this paper we use the techniques of Multiple Criterion Optimization (MCO) to provide a framework within which to consider all of these objectives simultaneously. Towards this end we develop a new method for estimating yield and the gradient of yield. This method is based upon a combination of the Simplicial Approximation technique of Director and Hachtel and the yield estimation procedure of Bandler and Abdel-Malek. The ideas of MCO and the new yield estimation procedure are applied to the design of a two-input MOSFET NAND gate.