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Open AccessJournal ArticleDOI

New Scatterometer for Spatial Distribution Measurements of Light Scattering from Materials

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TLDR
In this paper, a new scatterometer is composed of two ellipsoidal mirrors of revolution and an optical detection system, which enables us to measure diffuse reflectance and transmittance and to measure the spatial distribution of light scattering from almost all materials.
Abstract
A new scatterometer is composed of two ellipsoidal mirrors of revolution and an optical detection system. It enables us to absolutely measure diffuse reflectance and transmittance and to measure the spatial distribution of light scattering from almost all materials. The optical detection system has been developed both to measure total photo-intensity using a photodiode and to capture the imaging data using a CCD camera. This results in faster, more complete and often more accurate measurements than can be achieved with traditional goniometric methods and integrated sphere methods. The absolute total integrated reflectance and transmittance of well-known samples were measured and the spatial distribution of light scattering from a diffraction grating was captured and evaluated.

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Journal ArticleDOI

Non-Contact Method for Surface Roughness Measurement After Machining

TL;DR: In this article, a modified measurement method and its implementation, the results of intensity distribution in the defocusing plane, their analysis and interpretation are presented, and a good correlation between the measured and surface standard values with the correlation coefficient taking a range of values from 0.8 to 1 was achieved.
Journal ArticleDOI

Characterization of thermal performance, flux transmission performance and optical properties of MAX phase materials under concentrated solar irradiation

TL;DR: In this article, the thermal performance and optical properties of two MAX phase materials subjected to high concentrated flux are characterized. But the authors did not consider the effect of irradiance and temperature on the performance of the material.
Book ChapterDOI

Angle-Resolved Diffuse Reflectance and Transmittance

TL;DR: In this article, the authors discuss various methods for performing these measurements, including laser-and non-laser-based methods, and make a comparison between methods that use a radiance source and measure radiance and those that under fill the sample and measure power scattered per solid angle.
Proceedings ArticleDOI

Robust diffuser and roughness metrology tool for LED manufacturing

TL;DR: A novel oblique angle scatterometer designed and optimized for measurements of rough surfaces having a root mean square roughness value (RMS Roughness) on the order of 100 nm – 1000 nm or larger is built.
Book ChapterDOI

A NDT&E Methodology Based on Magnetic Representation for Surface Topography of Ferromagnetic Materials

Yanhua Sun, +1 more
TL;DR: In this paper, a new electromagnetic NDT and evaluation (NDT&E) methodology is provided based on the accurate magnetic representation of surface topography, in which a concaveshaped feature produces positive magnetic flux leakages (MFLs) and therefore forms a raised signal wave but a bump-shaped feature generates negative magnetic fields and therefore leads to a sunken signal wave.
References
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Proceedings ArticleDOI

New scanning gonio-photometer for extended BRTF measurements

TL;DR: In this paper, a new design of a scanning, out-of-plane gonio-photometer is presented with optimised mechanical and electronics design, reduced scanning time, optimised sensors resulting in high dynamic range, low noise and increased measurement capabilities (e.g. VIS,IR,UV and polarisation).
Journal ArticleDOI

A new absolute diffuse reflectance measurement in the near-IR region based on the modified double-sphere method

Hiroshi Shitomi, +1 more
- 01 Aug 2009 - 
TL;DR: In this paper, a modified double-sphere method was proposed to establish a spectral diffuse reflectance scale in the near-IR (NIR) region, which is a modified version of the double sphere method developed in 1966, and the modification reduced the uncertainty due to the area measurement of the auxiliary sphere.
Journal ArticleDOI

Symmetry X system and method for absolute measurements of reflectance and transmittance of specular samples

TL;DR: A symmetry X system that has been constructed for the absolute measurements of reflectance and transmittance of specular samples in the infrared region is described and it is disclosed that the geometric mean of two reflectance values is independent of the reflectance difference of the individual mirrors and the optical loss at each mirror.

Scatterometry of Ground Surfaces

T. Karpiński
TL;DR: In this article, a method for evaluation of the geometrical structure of ground surfaces by means of measurements and light scattering analysis was presented, and the most important factors affecting the spatial form of distribution of scattered light intensity were examined.
Proceedings ArticleDOI

An optical accessory for absolute reflection and transmission measurements in the wavelength region from 0.24μm to 25μm

TL;DR: In this article, the STAR GEM (Scatter, Transmission, and Absolute Reflection measurements using a Geminated Ellipsoid Mirror) method is used to measure absolute reflectance at almost any angle of incidence.
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