Patent
Point-diffraction interferometer utilizing separate reference and signal beam paths
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TLDR
In this article, a beam combiner is used to divide a linearly polarized converging incident signal beam into separate signal and reference beam paths prior to focus, and the beam turning mirrors are used to direct the signal and the reference beams to a beamcombiner.Abstract:
A split-path point-diffraction interferometer (SPPDI) comprising separate signal and reference beam paths is disclosed. A beamsplitter is used to divide a linearly polarized converging incident signal beam into separate signal and reference beam paths prior to focus. The reference beam path comprises a diffracting aperture located at the focal point of the signal beam. The diffracting aperture in the reference beam path produces an expanding, diffraction-limited reference wavefront. The signal and reference beam paths comprise linear polarizers whose yaw, pitch, and roll orientation may be freely adjusted. Yaw and pitch adjustment of one or more linear polarizers provides for adjustment of fringe spacing and orientation. Roll adjustment of one or more linear polarizers provides for adjustment of fringe contrast and intensity. Beam turning mirrors are used to direct the signal and reference beams to a beam combiner. Polarizing analysers are placed in the combined output beams produced by the beam combiner. A double-pass embodiment of an SPPDI comprising a beam splitter and compact laser source is disclosed.read more
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References
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Patent
Coded-fringe interferometric method and device for wavefront detection in optics
TL;DR: In this paper, the wavefront of a beam is detected by means of frequency coding of the fringes present in the function I(x,y) in the MZehnder interferometric configuration.
Patent
Light phase difference measuring method using an interferometer
TL;DR: In this article, a light phase difference measuring method is proposed for coherent light beam splitting into two light beams, allowing one of the two light be transmitted or reflected through or on a sample to be measured; a step of producing interference fringes having a high spatial frequency by inclining the other light beam relative to the optical path for incidence thereof so as to overlap these two light beam with each other.