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Process for forming an epitaxial layer having portions of different thicknesses

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TLDR
In this article, the epitaxial layer is grown by a first epoxial deposition phase selectively over only the silicon dioxide free regions of the front surface of the chip and then removed in situ by baking in hydrogen.
Abstract
An integrated circuit device uses a silicon chip having an epitaxial layer which has two portions of different thicknesses in which are formed separate junction transistors of different characteristics. In the growth of the epitaxial layer there is first formed on the front surface of the chip a localized sacrificial silicon dioxide layer removable in situ by baking in a reducing atmosphere. Then an epitaxial layer is grown by a first epitaxial deposition phase selectively over only the silicon dioxide free regions of the front surface of the chip. The sacrificial silicon dioxide layer is then removed in situ by baking in hydrogen. There is then resumed blanket growth of the epitaxial layer by a second epitaxial deposition phase. In the resulting chip, a large geometry junction transistor of relatively low switching speed and moderately high breakdown voltage (compared to 12 volts) is formed in the thicker epitaxial portion and a small geometry junction transistor of high switching speed and lower breakdown voltage is formed in the thinner epitaxial portion.

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Citations
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References
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Patent

Selective area double epitaxial process for fabricating silicon-on-insulator structures for use with MOS devices and integrated circuits

TL;DR: In this paper, a process for preparing selectively doped and recrystallized silicon-on-insulator semiconductor wafers is described, where successive amorphizing and annealing sequences are utilized to optimize the defect structure and doping of multiple regions or islands of the silicon on an insulator substrate.
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Method for forming uniformly thick selective epitaxial silicon

TL;DR: In this article, the first and second portions of a substrate were subject to a silicon-source gas and a predetermined concentration of chloride at a predetermined temperature, and the chloride concentration was selected so as to create a substantially equally thick monocrystalline silicon deposit on each of the substrate portions.
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