This article discusses the potential role of software-based self-testing in the microprocessor test and validation process, as well as its supplementary role in other classic functional- and structural-test methods. In addition, the article proposes a taxonomy for different SBST methodologies according to their test program development philosophy, and summarizes research approaches based on SBST techniques for optimizing other key aspects.

Microprocessor Software-Based Self-Testing

The huge investment in the design and production of multicore processors may be put at risk because the emerging highly miniaturized but unreliable fabrication technologies will impose significant barriers to the life-long reliable operation of future chips. Extremely complex, massively parallel, multi-core processor chips fabricated in these technologies will become more vulnerable to: (a) environmental disturbances that produce transient (or soft) errors, (b) latent manufacturing defects as well as aging/wearout phenomena that produce permanent (or hard) errors, and (c) verification inefficiencies that allow important design bugs to escape in the system. In an effort to cope with these reliability threats, several research teams have recently proposed multicore processor architectures that provide low-cost dependability guarantees against hardware errors and design bugs. This paper focuses on dependable multicore processor architectures that integrate solutions for online error detection, diagnosis, recovery, and repair during field operation. It discusses taxonomy of representative approaches and presents a qualitative comparison based on: hardware cost, performance overhead, types of faults detected, and detection latency. It also describes in more detail three recently proposed effective architectural approaches: a software-anomaly detection technique (SWAT), a dynamic verification technique (Argus), and a core salvaging methodology.

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Architectures for online error detection and recovery in multicore processors

Development and implementation of an FPGA based fractional order controller for a DC motor

Software-Based Self-Test is an effective methodology for devising the online testing of Systems-on-Chip. In the automotive field, a set of test programs to be run during mission mode is also called Core Self-Test library. This paper introduces many new contributions: (1) it illustrates the several issues that need to be taken into account when generating test programs for on-line execution; (2) it proposed an overall development flow based on ordered generation of test programs that is minimizing the computational efforts; (3) it is providing guidelines for allowing the coexistence of the Core Self-Test library with the mission application while guaranteeing execution robustness. The proposed methodology has been experimented on a large industrial case study. The coverage level reached after one year of team work is over 87 percent of stuck-at fault coverage, and execution time is compliant with the ISO26262 specification. Experimental results suggest that alternative approaches may request excessive evaluation time thus making the generation flow unfeasible for large designs.

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Development Flow for On-Line Core Self-Test of Automotive Microcontrollers

Embedded microprocessor cache memories suffer from limited observability and controllability creating problems during in-system tests. This paper presents a procedure to transform traditional march tests into software-based self-test programs for set-associative cache memories with LRU replacement. Among all the different cache blocks in a microprocessor, testing instruction caches represents a major challenge due to limitations in two areas: 1) test patterns which must be composed of valid instruction opcodes and 2) test result observability: the results can only be observed through the results of executed instructions. For these reasons, the proposed methodology will concentrate on the implementation of test programs for instruction caches. The main contribution of this work lies in the possibility of applying state-of-the-art memory test algorithms to embedded cache memories without introducing any hardware or performance overheads and guaranteeing the detection of typical faults arising in nanometer CMOS technologies.

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Software-Based Self-Test of Set-Associative Cache Memories

Software-based or instruction-based self-testing has recently emerged as an effective alternative for the manufacturing and online testing of microprocessors, and is progressively adopted by major microprocessor manufacturers mainly as a supplement to other mature and well-established testing approaches to reach higher test quality. Thus far, software-based self-test approaches presented in the literature have focused almost exclusively on uniprocessors. With the continuing prevalence of multiprocessors, the focus of such research approaches moves from the uniprocessor to the multiprocessor case. In this paper, we study the application of software-based self-testing on symmetric shared-memory multiprocessors (SMP) considering the most common interconnection architectures, shared bus and crossbar switch. We focus on the impact of the shared-memory system architecture, the cache coherence mechanisms, and the interconnection architecture on the execution time of self-test programs running on each separate core and exploit the SMP's parallelism during testing to reduce the test execution time. We propose a generic methodology that allocates the test programs and test responses into the shared on-chip memory and schedules the test routines among the cores aiming at the reduction of the total test application time, and thus, test cost, for the SMP, by increasing the execution parallelism and reducing both bus contentions and data cache invalidations. We demonstrate the proposed solutions with detailed experiments on several two-core, four-core, and eight-core SMP benchmarks based on a popular RISC benchmark processor using both the shared bus and the crossbar switch interconnection architectures.

Software-Based Self-Testing of Symmetric Shared-Memory Multiprocessors

The increasing use of field programmable devices for the implementation of embedded processors and systems-on-chip even in mission-critical applications demands for fault tolerant techniques to improve reliability and extend system lifetime. Furthermore, the runtime partial reconfiguration potentials of the latest FPGA devices along with the availability of unused programmable resources in most FPGA designs provide interesting opportunities to build fault tolerant mechanisms. In this paper, we exploit the latest dynamic reconfiguration advances and propose a fault-tolerant FPGA processor architecture based on runtime reconfigurable modules. We partition the processor core into reconfigurable modules and duplicate these modules to implement a concurrent error detection mechanism. For every duplicated module we generate precompiled configurations which include spare resources and are used to runtime repair the defective module. The processor freezes upon the detection of an error and an on-chip controller coordinates the processor recovery and repair in a reconfiguration process transparent to the processor. We demonstrate the proposed approach in OpenRISC core, a widely-used open-source soft processor.

Fault tolerant FPGA processor based on runtime reconfigurable modules

Testing communication peripherals in an environment of systems on a chip is particularly challenging. The authors explore two test program generation approaches-one fully automated and one deterministically guided-and propose a novel combination of the two schemes that can be applied in a generic manner on a wide set of communication cores.

Test Program Generation for Communication Peripherals in Processor-Based SoC Devices

Instruction-based or software-based self-testing (SBST) is a scalable functional testing paradigm that has gained increasing acceptance in testing of single-threaded uniprocessors. Recent computer architecture trends towards chip multiprocessing and multithreading have raised new challenges in the test process. In this paper, we present a novel self-test optimization strategy for multithreaded, multicore microprocessor architectures and apply it to both manufacturing testing (execution from on-chip cache memory) and post-silicon validation (execution from main memory) setups. The proposed self-test program execution optimization aims to: (a) take maximum advantage of the available execution parallelism provided by multiple threads and multiple cores, (b) preserve the high fault coverage that single-thread execution provides for the processor components, and (c) enhance the fault coverage of the thread-specific control logic of the multithreaded multiprocessor. The proposed multithreaded (MT) SBST methodology generates an efficient multithreaded version of the test program and schedules the resulting test threads into the hardware threads of the processor to reduce the overall test execution time and on the same time to increase the overall fault coverage. We demonstrate our methodology in the OpenSPARC T1 processor model which integrates eight CPU cores, each one supporting four hardware threads. MT-SBST methodology and scheduling algorithm significantly speeds up self-test time at both the core level (3.6 times) and the processor level (6.0 times) against single-threaded execution, while at the same time it improves the overall fault coverage. Compared with straightforward multithreaded execution, it reduces the self-test time at both the core level and the processor level by 33% and 20%, respectively. Overall, MT-SBST reaches more than 91% stuck-at fault coverage for the functional units and 88% for the entire chip multiprocessor, a total of more than 1.5M logic gates.

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MT-SBST: Self-test optimization in multithreaded multicore architectures

The ever increasing adoption of field programmable devices in various application domains for building complex embedded systems based on FPGA processors along with the reliability issues having emerged for FPGA devices built with the latest nanometer technologies, have raised the need for new fault tolerant techniques in order to improve dependability and extend system lifetime. In addition, the runtime partial reconfiguration technology highly mature in the modern FPGA families along with the availability of unused programmable resources in most FPGA designs provide new and interesting opportunities to build advanced fault tolerance mechanisms. In this paper, we exploit the dynamic reconfiguration potential of today's FPGA architectures and the advances in the related design support tools and we propose a fault-tolerant approach for FPGA embedded processors based on runtime partial reconfiguration. According to the proposed methodology, the processor core is partitioned into reconfigurable modules and each module is duplicated to implement a concurrent error detection mechanism. Precompiled configurations containing spare resources are generated for each duplicated module and are used to repair at runtime the defective modules. Also, a fault tolerance scheme for the proxy logic of the reconfigurable modules, which cannot move in the alternative configurations along with the rest logic, is proposed. Moreover, a compression method for the alternative partial bitstreams, which significantly reduces the high storage space requirements of the proposed approach, is presented. Two different hardware decompression schemes have been implemented in a Virtex-5 device and compared in terms of area overhead and decompression latency. Furthermore, a thorough examination has been performed, regarding how the percentage of the spare resources and their allocation in the reconfigurable regions affect the compression efficiency and the processor performance. Finally, the proposed approach has been demonstrated in three different components --- ALU, multiplier-accumulator, and instruction-fetch unit --- of an open-source embedded processor.

A. Apostolakis

Papers

Software-Based Self-Testing of Symmetric Shared-Memory Multiprocessors

Fault tolerant FPGA processor based on runtime reconfigurable modules

Test Program Generation for Communication Peripherals in Processor-Based SoC Devices

MT-SBST: Self-test optimization in multithreaded multicore architectures

A Fault Tolerant Approach for FPGA Embedded Processors Based on Runtime Partial Reconfiguration