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A. Gupta
Researcher at Rockwell International
Publications - 1
Citations - 61
A. Gupta is an academic researcher from Rockwell International. The author has contributed to research in topics: Yield (engineering). The author has an hindex of 1, co-authored 1 publications receiving 61 citations.
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Defect analysis and yield degradation of integrated circuits
TL;DR: A method of optimum chip placement is described, and the results of computer calculations showing yield as a function of chip size are given assuming different defect density distributions.