A memory device including a first memory sector and a second memory sector, each of which includes a respective plurality of local bit lines, which may be selectively coupled to a plurality of main bit lines. The memory device further includes a first amplifier and a second amplifier, and a routing circuit, arranged between the main bit lines and the first and second amplifiers. The routing circuit includes: a first lower switch, arranged between a first lower main bit line and a first input of the first amplifier; a second lower switch, arranged between the first lower main bit line and a first input of the second amplifier; a first upper switch, arranged between a first upper main bit line and the first input of the first amplifier; and a second upper switch, arranged between the first upper main bit line and the first input of the second amplifier. The second inputs of the first and second amplifiers are coupled to a second lower main bit line and to a second upper main bit line, respectively.

Device for switching between different reading modes of a non-volatile memory and method for reading a non-volatile memory

The present invention provides a differential sensing circuit with a dynamic voltage reference for a single-ended bit line memory is disclosed. The exemplary differential sensing circuit comprises: a dynamic voltage reference generating unit and a differential sensing amplifying unit. The dynamic voltage reference generating unit is coupled to an input voltage, and utilized for receiving a setting signal to generate the dynamic voltage reference. The differential sensing amplifying unit is coupled to the single-ended bit line memory and the dynamic voltage reference generating unit, and utilized for receiving at least an input signal from the single-ended bit line memory and the dynamic voltage reference from the dynamic voltage reference generating unit, so as to generate at least an output signal accordingly.

Differential sensing circuit with dynamic voltage reference for single-ended bit line memory

The present disclosure relates to a structure which includes at least one keeper circuit which is configured to hold data to a precharged state during a first operation and be disabled during a second operation.

Data dependent keeper on global data lines

Embodiments include a method, memory system and a device for the operating a bit-line sensing circuit for bias-controlled bit-line sensing, the embodiments include an input for receiving a single-ended local bit-line signal, a pass device having a first terminal coupled to the input and a second terminal connected to a global bit-line node, The embodiments also include a first inverter having an input connected to the global bit-line node, a header circuit coupled to the first inverter and a first direct current (DC) bias circuit, and a footer circuit coupled to the first inverter and a second DC bias circuit. The embodiments include a second gated inverter having an input coupled to an output of the first inverter.

Bias-controlled bit-line sensing scheme for eDRAM

A comparator circuit includes a first transistor have a control electrode coupled to a first input voltage, a first current electrode coupled to a second input voltage, and a second current electrode coupled to a first circuit node. The circuit also includes a first inverter coupled to a first voltage supply terminal and having a first input coupled to the first circuit node and an output, a second transistor having a control electrode coupled to the output of the first inverter, and an active resistive element coupled in series between the first circuit node and a first current electrode of the second transistor.

Comparator circuit with feedback and method of operation

A single-ended input sense amplifier uses a pass device to couple the input local bit-line to a global bit-line evaluation node. The sense amplifier also includes a pair of cross-coupled inverters, a first inverter of which has an input that coupled directly to the global bit-line evaluation node. The output of the second inverter is selectively coupled to the global bit-line evaluation node in response to a control signal, so that when the pass device is active, the local bit line charges or discharges the global bit-line evaluation node without being affected substantially by a state of the output of the second inverter. When the control signal is in the other state, the cross-coupled inverter forms a latch. An internal output control circuit of the second inverter interrupts the feedback provided by the second inverter in response to the control signal.

Abraham Mathews

Papers

Gated-feedback sense amplifier for single-ended local bit-line memories