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Aleix G. Güell

Researcher at University of Warwick

Publications -  31
Citations -  2088

Aleix G. Güell is an academic researcher from University of Warwick. The author has contributed to research in topics: Graphene & Carbon nanotube. The author has an hindex of 23, co-authored 31 publications receiving 1781 citations. Previous affiliations of Aleix G. Güell include University of California, Irvine & Coventry Health Care.

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Boron doped diamond ultramicroelectrodes : a generic platform for sensing single nanoparticle electrocatalytic collisions

TL;DR: Boron doped diamond disk ultramicroelectrodes have been used to sense single nanoparticle electrocatalytic collision events and single NP collisions for hydrazine oxidation at Au and Pt NPs were shown to be markedly different.
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Preparation of reliable probes for electrochemical tunneling spectroscopy

TL;DR: A new procedure to prepare Pt/Ir probes for electrochemical scanning tunneling microscopy (STM) and spectroscopy applications and the experimental setup and the improvements over previous methods are presented.
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Electrochemistry at carbon nanotube forests: sidewalls and closed ends allow fast electron transfer

TL;DR: The electrochemical properties of the closed ends and sidewalls of pristine carbon nanotube forests are investigated directly using a nanopipet electrochemical cell, and both are shown to promote fast electron transfer, without any activation or processing of the carbon Nanotube material required.
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Tunable Two-Photon Excited Luminescence in Single Gold Nanowires Fabricated by Lithographically Patterned Nanowire Electrodeposition

TL;DR: In this article, the two-photon excited luminescence (TPEL) of single gold nanowires was investigated under far-field illumination with picosecond pulses.
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Nanomechanics of silicon surfaces with atomic force microscopy: an insight to the first stages of plastic deformation.

TL;DR: The use of stiff cantilevers with diamond tips allows us to perform nanoindentations on hard covalent materials such as silicon with atomic force microscopy, showing a drastic increase with penetration depths below 5 nm.