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Alexei S. Komolov

Researcher at Saint Petersburg State University

Publications -  91
Citations -  952

Alexei S. Komolov is an academic researcher from Saint Petersburg State University. The author has contributed to research in topics: Work function & Thin film. The author has an hindex of 17, co-authored 85 publications receiving 843 citations. Previous affiliations of Alexei S. Komolov include University of Copenhagen & Roskilde University.

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Polymer coated quartz crystal microbalance sensors for detection of volatile organic compounds in gas mixtures.

TL;DR: Principal components analysis (PCA) has been performed based on the QCM measurement results, which shows that this QCM sensors array has very good utilizing potential on sensing both polar and low-polar/nonpolar VOC gases.
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Relation between Electron Scattering Resonances of Isolated NTCDA Molecules and Maxima in the Density of Unoccupied States of Condensed NTCDA Layers

TL;DR: The present results indicate that the empty levels of individual NTCDA molecules are stabilized in the solid state, but their relative energies remain nearly unaltered.
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Poly(9-vinylcarbazole)–graphene oxide composite field-effect transistors with enhanced mobility

TL;DR: In this paper, a solution processed hybrid organic field-effect transistors (OFETs) incorporating both organic semiconductor (PVK) and graphene oxide (GO) flakes was reported.
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Interface formation between thin Cu-phthalocyanine films and crystalline and oxidized silicon surfaces

TL;DR: In this article, the evolution of the surface potential and density of unoccupied electronic states located 0−25 eV above vacuum level were measured during the film deposition using an incident beam of low energy electrons using total current electron spectroscopy (TCS).
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Thermally induced modification of the graphene oxide film on the tantalum surface

TL;DR: In this paper, the interface chemical reactions, the deoxygenation and the overall thermal stability of the ex situ deposited graphene oxide (GO) thick film on the polycrystalline tantalum surface were studied by means of x-ray photoelectron spectroscopy (XPS) at room temperature and after annealing up to 600 ǫ