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Ali Roshanghias

Researcher at University of Vienna

Publications -  62
Citations -  638

Ali Roshanghias is an academic researcher from University of Vienna. The author has contributed to research in topics: Soldering & Flip chip. The author has an hindex of 13, co-authored 50 publications receiving 414 citations. Previous affiliations of Ali Roshanghias include Sharif University of Technology & Infineon Technologies.

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Journal ArticleDOI

The effects of pulse plating variables on morphology and corrosion behavior of Zn–Fe alloy coatings

TL;DR: In this article, the effects of pulse plating variables such as current density, off-time, frequency and pulse modes on the morphology and phase structure of Zn-Fe deposits were studied by scanning electron microscopy (SEM), X-ray diffraction (XRD), and energy dispersive spectrometry (EDS) analysis.
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Sinter bonding of inkjet-printed Ag die-attach as an alternative to Ag paste

TL;DR: In this paper, the advantages and challenges of employing inkjet printing as a means for dispensing die-attach materials for advanced electronic packaging applications are discussed, and the feasibility of employing an inkjet-printable Ag ink as a novel die attach material was investigated.
Proceedings ArticleDOI

Digital micro-dispension of non-conductive adhesives (NCA) by inkjet printer

TL;DR: In this article, the deposition of nonconductive adhesives (NCA) by means of an inkjet printer equipped with an industrial inkjet print-head was investigated, and individual droplets of different kinds of NCA were jetted from small diameter vessels directly to a specified position on the substrate to create the bonding patterns for die-attachment.
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Inkjet printed adhesives for advanced M(O)EMS packaging

TL;DR: In this article, low-temperature adhesive bonding methodologies facilitated by inkjet printing technology were investigated for low-stress M(O)EMS packaging, in which a controlled amount of adhesives jetted by a digital printer can mitigate several bonding-induced defects.
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Cross-sectional nanoindentation (CSN) studies on the effect of thickness on adhesion strength of thin films

TL;DR: In this paper, the cross-sectional nanoindentation (CSN) technique has been employed to investigate the adhesion behavior of Titanium-Tungsten (TiW) thin films in various thickness on silicon substrate.