A
Alireza Rohani
Researcher at Amirkabir University of Technology
Publications - 6
Citations - 34
Alireza Rohani is an academic researcher from Amirkabir University of Technology. The author has contributed to research in topics: Fault injection & Static random-access memory. The author has an hindex of 4, co-authored 6 publications receiving 34 citations.
Papers
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Proceedings ArticleDOI
An Analysis of Fault Effects and Propagations in AVR Microcontroller ATmega103(L)
Alireza Rohani,Hamid R. Zarandi +1 more
TL;DR: This paper presents an analysis of the effects and propagations of transient faults by simulation-based fault injection into the AVR microcontroller, using VHDL language to propose the fault-tolerant AVRmicrocontroller.
Proceedings ArticleDOI
A New CLB Architecture for Tolerating SEU in SRAM-Based FPGAs
Alireza Rohani,Hamid R. Zarandi +1 more
TL;DR: Experimental results show that the proposed architecture can correct 100% SEU in the configuration memory of CLB without any user intervention or reconfiguration.
Journal ArticleDOI
Two effective methods to mitigate soft error effects in SRAM-based FPGAs
Alireza Rohani,Hamid R. Zarandi +1 more
TL;DR: An effective architecture that can mitigate Single Event Upset (SEU) effects in SRAM-based FPGAs is proposed and results show that the area, power, and delay overheads are respectively 179%, 94%, and 60% in comparison with the simple architecture.
Proceedings ArticleDOI
Mitigating and tolerating SEU effects in switch modules of SRAM-based FPGAs
Alireza Rohani,Hamid R. Zarandi +1 more
TL;DR: The experimental results show that the proposed methods can detect or correct 100% single errors in Switch Modules by imposing area overhead between 2% and 60%, delay overhead between 25% and 100% and power consumption overhead between 1% and 25%.
Proceedings ArticleDOI
An analysis of fault effects and propagations in ZPU: The world's smallest 32 bit CPU
TL;DR: This paper presents an analysis of the effects and propagations of transient faults by simulation-based fault injection into the ZPU processor by injecting 5800 transient faults into the main components of Z PU processor that is described in VHDL language.