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Aman Kansal
Researcher at Microsoft
Publications - 160
Citations - 15209
Aman Kansal is an academic researcher from Microsoft. The author has contributed to research in topics: Wireless sensor network & Data center. The author has an hindex of 54, co-authored 159 publications receiving 14790 citations. Previous affiliations of Aman Kansal include University of California, Los Angeles & Carnegie Mellon University.
Papers
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Proceedings ArticleDOI
Coordinating camera motion for sensing uncertainty reduction
TL;DR: Methods which use low resolution side information to adaptively control the motion of deployed cameras such that a smaller number of cameras, pV1/v2 can achieve the effective coverage of V1/V2 cameras.
Patent
Power supply for use with a slow-response power source
TL;DR: In this paper, a power supply is described which provides power to a load, such as a load including one or more computing devices, using a slow response power source (such as a fuel-driven mechanism) to handle a slow-moving component of the demand level presented by the load, and uses a fast-response power source such as battery or a capacitor, etc.
Journal Article
Controlled Mobility for Increased Lifetime in Wireless Sensor Networks
TL;DR: This work explores the option of a chargeable mobile base station traversing the network, and the nodes transfer the data when it is near, and this improves the lifetime of the network.
Proceedings ArticleDOI
Poster: supporting collaborative sensing applications
TL;DR: This paper proposes a platform design that provides high-level "virtual sensor" abstractions and enables new virtual sensors to be bootstrapped from existing ones.
Posted Content
Heterogeneous-Reliability Memory: Exploiting Application-Level Memory Error Tolerance
Yixin Luo,Sriram Govindan,Bikash Sharma,Mark Santaniello,Justin Meza,Aman Kansal,Jie Liu,Badriddine Khessib,Kushagra Vaid,Onur Mutlu +9 more
TL;DR: The DSN-44 paper is the first to understand how tolerant different data-intensive applications are to memory errors and design a new memory system organization that matches hardware reliability to application tolerance in order to reduce system cost.