A
Andreas Stierle
Researcher at University of Hamburg
Publications - 180
Citations - 4432
Andreas Stierle is an academic researcher from University of Hamburg. The author has contributed to research in topics: Oxide & Nanoparticle. The author has an hindex of 32, co-authored 164 publications receiving 3800 citations. Previous affiliations of Andreas Stierle include University of Siegen & Max Planck Society.
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Initial corrosion observed on the atomic scale
Frank Uwe Renner,Andreas Stierle,Helmut Dosch,Helmut Dosch,Dieter M. Kolb,Tien-Lin Lee,Jörg Zegenhagen +6 more
TL;DR: Atomic-scale observations of the initial stages of corrosion of a Cu3Au(111) single crystal alloy within a sulphuric acid solution are reported and the microscopic structural changes associated with a general passivation phenomenon of which the origin has been hitherto unclear are revealed.
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Shape Changes of Supported Rh Nanoparticles During Oxidation and Reduction Cycles
P. Nolte,Andreas Stierle,N. Y. Jin-Phillipp,N. Kasper,Tobias U. Schülli,Helmut Dosch,Helmut Dosch +6 more
TL;DR: An oxygen-induced shape transformation of rhodium nanoparticles on magnesium oxide (001) substrates that is lifted upon carbon monoxide exposure at 600 kelvin is reported.
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Kinetic hindrance during the initial oxidation of Pd(100) at ambient pressures
Edvin Lundgren,Johan Gustafson,Anders Mikkelsen,J. N. Andersen,Andreas Stierle,Helmut Dosch,Helmut Dosch,Mira Todorova,Jutta Rogal,Karsten Reuter,Matthias Scheffler +10 more
TL;DR: A strong kinetic hindrance to the bulk oxide formation is identified even at temperatures as high as 675 K, compared to first-principles atomistic thermodynamics.
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X-ray Diffraction Study of the Ultrathin Al2O3 Layer on NiAl(110)
TL;DR: In this article, the complex atomic structure of well-ordered alumina overlayers on NiAl(110) was solved by surface x-ray diffraction, where the oxide layer is composed of a double layer of strongly distorted hexagonal oxygen ions that hosts aluminum ions on both octahedral and tetrahedral sites with equal probability.
Journal ArticleDOI
High-energy surface X-ray diffraction for fast surface structure determination.
Johan Gustafson,Mikhail Shipilin,Chu Zhang,Andreas Stierle,Uta Hejral,Uta Ruett,Olof Gutowski,Per-Anders Carlsson,Magnus Skoglundh,Edvin Lundgren +9 more
TL;DR: An x-ray-diffraction–based characterization method is demonstrated that uses high-energy photons (85 kiloelectron volts) to provide unexpected gains in data acquisition speed by several orders of magnitude and enables structural determinations of surfaces on time scales suitable for in situ studies.