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Andrew J. Fleming

Researcher at University of Newcastle

Publications -  257
Citations -  7678

Andrew J. Fleming is an academic researcher from University of Newcastle. The author has contributed to research in topics: Piezoelectricity & Vibration. The author has an hindex of 44, co-authored 254 publications receiving 6849 citations. Previous affiliations of Andrew J. Fleming include Newcastle College & University of Stuttgart.

Papers
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Proceedings ArticleDOI

Electromagnetic shunt damping

TL;DR: In this paper, a method for electromagnetic shunt damping (EMSD) is presented, which requires small shunt voltages, can provide large stroke and can dampen larger mechanical structures.
Journal ArticleDOI

Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis.

TL;DR: The present article gives a detailed description of the fully coupled tube scanner dynamics over a wide frequency range modeled by finite element (FE) analysis using the commercially available software package ANSYS.
Proceedings ArticleDOI

Application of MPC to an active structure using sampling rates up to 25kHz

TL;DR: In this article, the authors demonstrate the implementation of model predictive control (MPC) for vibration suppression of the first five bending modes of an active structure, which requires a 5kHz sampling rate, which is achieved using a standard active set optimisation technique running on a 200MHz digital signal processor.
Journal ArticleDOI

Adaptive electromagnetic shunt damping

TL;DR: In this article, a single-mode resonant shunt controller that adapts to environmental conditions using two different adaptation strategies is proposed, based on minimizing the root mean square (RMS) vibration and minimizing the phase difference between two measurable signals.
Proceedings ArticleDOI

High-speed serial-kinematic AFM scanner: Design and drive considerations

TL;DR: The design of a flexure guided, two-axis nanopositioner driven by piezoelectric stack actuators is described, specifically designed for high-speed scanning probe microscope (SPM) applications.