A
Angela Duparré
Researcher at Fraunhofer Society
Publications - 177
Citations - 2826
Angela Duparré is an academic researcher from Fraunhofer Society. The author has contributed to research in topics: Scattering & Light scattering. The author has an hindex of 27, co-authored 177 publications receiving 2613 citations. Previous affiliations of Angela Duparré include French Alternative Energies and Atomic Energy Commission & Moscow State University.
Papers
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Surface characterization techniques for determining the root-mean-square roughness and power spectral densities of optical components
TL;DR: Two-dimensional power spectral density functions were calculated from the digitized measurement data, and roughnesses were obtained by integrating areas under the PSD curves between fixed upper and lower band limits.
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Total integrated scatter from surfaces with arbitrary roughness, correlation widths, and incident angles
TL;DR: In this article, the authors calculate the band-limited relevant roughness from surface metrology data, then present parametric plots of the TIS for optical surfaces with arbitrary roughness, surface correlation widths, and incident angles.
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Modeling of light scattering in different regimes of surface roughness
Sven Schröder,Angela Duparré,Luisa Coriand,Andreas Tünnermann,Dayana H Penalver,James E. Harvey +5 more
TL;DR: It is demonstrated that the approximate scatter models yield surprisingly accurate results and at the same time provide insight into light scattering phenomena.
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Ultraviolet optical and microstructural properties of MgF2 and LaF3 coatings deposited by ion-beam sputtering and boat and electron-beam evaporation.
Detlev Ristau,Stefan Günster,Salvador Bosch,Angela Duparré,Enrico Masetti,Josep Ferré-Borrull,George Kiriakidis,Francesca Peiró,Etienne Quesnel,Alexander V. Tikhonravov +9 more
TL;DR: The IBS process achieves the best homogeneity and the lowest surface roughness values of the processes compared in the joint experiment, and in contrast to MgF2 boat and e-beam evaporated coatings, IBS coatings exhibit high compressive stress of as much as 910 MPa.
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Angle-resolved scattering: an effective method for characterizing thin-film coatings
TL;DR: A simplified model is presented that introduces two parameters that describes optical thickness deviations from the perfect design, and the roughness evolution inside the coating according to a power law, and is used to investigate structural and alteration effects of HR coatings for 193 nm, as well as laser-induced degradation effects in Rugate filters for 355 nm.