The study of nanostructures is creating a need for microscopes that can see beyond the limits of conventional visible light and ultraviolet microscopes. X-ray imaging is a promising option. A new microscope described this week achieves unprecedented resolution, and has the ability to see through containing material. It features a specially made two-component zone plate — a lens with concentric zones rather like the rings in the Fresnel lenses familiar in overhead projectors and elsewhere — that makes use of diffraction to project an image into a CCD camera sensitive to soft X-rays. Spatial resolution of better than 15 nm is possible. Analytical tools that have spatial resolution at the nanometre scale are indispensable for the life and physical sciences. It is desirable that these tools also permit elemental and chemical identification on a scale of 10 nm or less, with large penetration depths. A variety of techniques1,2,3,4,5,6,7 in X-ray imaging are currently being developed that may provide these combined capabilities. Here we report the achievement of sub-15-nm spatial resolution with a soft X-ray microscope—and a clear path to below 10 nm—using an overlay technique for zone plate fabrication. The microscope covers a spectral range from a photon energy of 250 eV (∼5 nm wavelength) to 1.8 keV (∼0.7 nm), so that primary K and L atomic resonances of elements such as C, N, O, Al, Ti, Fe, Co and Ni can be probed. This X-ray microscopy technique is therefore suitable for a wide range of studies: biological imaging in the water window8,9; studies of wet environmental samples10,11; studies of magnetic nanostructures with both elemental and spin-orbit sensitivity12,13,14; studies that require viewing through thin windows, coatings or substrates (such as buried electronic devices in a silicon chip15); and three-dimensional imaging of cryogenically fixed biological cells9,16.

Soft X-ray microscopy at a spatial resolution better than 15 nm

Two new soft X-ray scanning transmission microscopes located at the Advanced Light Source (ALS) have been designed, built and commissioned. Interferometer control implemented in both microscopes allows the precise measurement of the transverse position of the zone plate relative to the sample. Long-term positional stability and compensation for transverse displacement during translations of the zone plate have been achieved. The interferometer also provides low-distortion orthogonal x, y imaging. Two different control systems have been developed: a digital control system using standard VXI components at beamline 7.0, and a custom feedback system based on PC AT boards at beamline 5.3.2. Both microscopes are diffraction limited with the resolution set by the quality of the zone plates. Periodic features with 30 nm half period can be resolved with a zone plate that has a 40 nm outermost zone width. One microscope is operating at an undulator beamline (7.0), while the other is operating at a novel dedicated bending-magnet beamline (5.3.2), which is designed specifically to illuminate the microscope. The undulator beamline provides count rates of the order of tens of MHz at high-energy resolution with photon energies of up to about 1000 eV. Although the brightness of a bending-magnet source is about four orders of magnitude smaller than that of an undulator source, photon statistics limited operation with intensities in excess of 3 MHz has been achieved at high energy resolution and high spatial resolution. The design and performance of these microscopes are described.

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Interferometer‐controlled scanning transmission X‐ray microscopes at the Advanced Light Source

To extend soft x-ray microscopy to a resolution of order 10 nm or better, we developed a new nanofabrication process for Fresnel zone plate lenses. The new process, based on the double patterning technique, has enabled us to fabricate high quality gold zone plates with 12 nm outer zones. Testing of the zone plate with the full-field transmission x-ray microscope, XM-1, in Berkeley, showed that the lens clearly resolved 12 nm lines and spaces. This result represents a significant step towards 10 nm resolution and beyond.

http://xrm.phys.northwestern.edu/research/pdf_papers/2009/chao_oe_2009.pdf

Demonstration of 12 nm resolution Fresnel zone plate lens based soft x-ray microscopy

NEXAFS microscopy and resonant scattering: Composition and orientation probed in real and reciprocal space

Using Fresnel zone plates made with our robust nanofabrication processes, we have successfully achieved 10 nm spatial resolution with soft x-ray microscopy. The result, obtained with both a conventional full-field and scanning soft x-ray microscope, marks a significant step forward in extending the microscopy to truly nanoscale studies.

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Real space soft x-ray imaging at 10 nm spatial resolution.

Short wavelength x-ray radiation microscopy is well suited for a number of material and life science studies. The x-ray microscope (XM1) at the Advanced Light Source Synchrotron in Berkeley, California uses two diffractive Fresnel zone plate lenses. The first is a large condenser lens, which collects soft x-ray radiation from a bending magnet, focuses it, and serves as a linear monochromator. The second is the objective zone plate lens, which magnifies the image of the specimen onto a high-efficiency charge coupled device detector. The objective lens determines the numerical aperture and ultimate resolution. New objective lens zone plates with a minimum linewidth of 25 nm and excellent linewidth control have been fabricated using Berkeley Lab’s 100 keV Nanowriter electron beam lithography tool, a calixarene high-resolution negative resist, and gold electroplating. Although the condenser zone plate is less critical to the resolution of the instrument, its efficiency determines the flux on the sample and ul...

/pdf/nanofabrication-and-diffractive-optics-for-high-resolution-x-54bwhvqr8h.pdf

Angelic Lucero

Papers

Nanofabrication and diffractive optics for high-resolution x-ray applications