Showing papers by "Bao Yang published in 2001"
Louisiana Tech University1, College of William & Mary2, Massachusetts Institute of Technology3, University of Maryland, College Park4, University of Illinois at Urbana–Champaign5, California Institute of Technology6, Virginia Tech7, Oak Ridge National Laboratory8, University of Kentucky9, Argonne National Laboratory10
TL;DR: In this paper, the authors measured the vector analyzing power in transversely polarized elastic electron-proton scattering at Q^2=0.1(GeV/c)^2 and large scattering angles.
Abstract: We report the first measurement of the vector analyzing power in inclusive transversely polarized elastic electron-proton scattering at Q^2=0.1(GeV/c)^2 and large scattering angles. This quantity must vanish in the single virtual photon exchange, plane-wave impulse approximation for this reaction, and can therefore provide information on two photon exchange amplitudes for electromagnetic interactions with hadronic systems. The observable we have measured is driven by the imaginary part of the two photon exchange amplitude, the hadronic side of which is simply the Compton amplitude for the proton with two virtual photons. We find a small but nonzero value of A=-15.4±5.4 ppm.
75 citations
TL;DR: In this article, it was shown that phonon confinement and the associated group velocity reduction are the causes of the observed drop in the crossplane thermal conductivity of semiconductor superlattices.
Abstract: Past studies suggest that phonon confinement and the associated group velocity reduction are the causes of the observed drop in the cross-plane thermal conductivity of semiconductor superlattices. ...
63 citations
TL;DR: In this article, a set of methods were developed to measure the Seebeck coefficient, electrical conductivity, and thermal conductivity in the cross-plane direction of thin films, which were applied to Si/Ge superlattices grown by molecular beam epitaxy.
Abstract: In this paper, a set of methods is developed to measure the Seebeck coefficient, electrical conductivity, and thermal conductivity in the cross-plane direction of thin films. The method employs microfabricated heaters, voltage and temperature sensors, and phase-lock amplifiers to determine the temperature and Seebeck voltage oscillation in the cross-plane direction of the samples, from which the thermal conductivity and Seebeck coefficient of thin films are determined simultaneously. The cross-plane electrical conductivity is also measured by a modified transmission line model. These methods are applied to Si/Ge superlattices grown by molecular beam epitaxy.
4 citations