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Benjamin D. Myers
Researcher at Northwestern University
Publications - 37
Citations - 2937
Benjamin D. Myers is an academic researcher from Northwestern University. The author has contributed to research in topics: Nanoparticle & Electron-beam lithography. The author has an hindex of 16, co-authored 36 publications receiving 2366 citations. Previous affiliations of Benjamin D. Myers include University of Illinois at Urbana–Champaign.
Papers
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Journal ArticleDOI
Suppressing Electron Exposure Artifacts: An Electron Scanning Paradigm with Bayesian Machine Learning.
TL;DR: Direct dose reduction and suppression of beam-induced artifacts through under-sampling pixels are demonstrated, by as much as 80% reduction in dosage, using a commercial scanning electron microscope with an electrostatic beam blanker and a dictionary learning in-painting algorithm.
Patent
Catalyzed reinforced polymer composites
TL;DR: In this article, a method for making a fiber-reinforced composite comprises dispensing a reactive liquid into a mold, which comprises fibers and a single-component activator on the fibers.
Journal ArticleDOI
Stimuli-Responsive DNA-Linked Nanoparticle Arrays as Programmable Surfaces.
TL;DR: The power of DNA-linked nanoparticle assembly is coupled to a grayscale patterning technique to create programmable surfaces for assembly and thermally activated reorganization of gold nanoparticle arrays, with important implications for the design and fabrication of reconfigurable nanoparticles arrays for application as structurally tunable optical metasurfaces.
Journal ArticleDOI
High-pressure torsion of copper samples containing columns of highly aligned nanotwins
Carla J Shute,Benjamin D. Myers,Y. Liao,Shuyou Li,Andrea M. Hodge,Troy W. Barbee,Yuntian Zhu,J.R. Weertman +7 more
TL;DR: In this article, high-pressure torsion was used to transform columns of aligned nanotwins into a 3D grain structure to a depth of about 5μm.
Patent
Method for acquiring intentionally limited data and the machine learning approach to reconstruct it
TL;DR: In this paper, the authors describe a data capturing and processing system that intentionally captures data and/or data sets with missing pieces of information to enable simultaneous pattern recognition and image recovery.