B
Burkhard Kaulich
Researcher at Elettra Sincrotrone Trieste
Publications - 94
Citations - 2584
Burkhard Kaulich is an academic researcher from Elettra Sincrotrone Trieste. The author has contributed to research in topics: Microscopy & Microscope. The author has an hindex of 27, co-authored 89 publications receiving 2347 citations. Previous affiliations of Burkhard Kaulich include AREA Science Park & London Centre for Nanotechnology.
Papers
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Photoelectron microscopy and applications in surface and materials science
TL;DR: In this article, the authors review the recent achievements of photoelectron microscopy (PEM), which is a rapidly developing technique that is significantly advancing the frontiers of surface and materials science.
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Transmission and emission x-ray microscopy: operation modes, contrast mechanisms and applications.
TL;DR: Implementation of lensless or diffraction imaging helps to enhance the lateral resolution of x-ray imaging to the wavelength dependent diffraction limit and a variety of phase contrast techniques enhances the structural sensitivity, especially for the hard x-rays regime.
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Soft X-ray spectromicroscopy using ptychography with randomly phased illumination
Andrew Maiden,G. R. Morrison,G. R. Morrison,Burkhard Kaulich,Burkhard Kaulich,Alessandra Gianoncelli,John M. Rodenburg +6 more
TL;DR: A novel ptychographic experiment using a randomly phased X-ray probe to considerably reduce the dynamic range of the recorded diffraction patterns, which shows that images can be reconstructed reliably and robustly from this setup, even when scatter from the specimen is weak.
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Localization of aluminium in tea (Camellia sinensis) leaves using low energy X-ray fluorescence spectro-microscopy.
Roser Tolrà,Katarina Vogel-Mikuš,Roghieh Hajiboland,Roghieh Hajiboland,Peter Kump,Paula Pongrac,Paula Pongrac,Burkhard Kaulich,Alessandra Gianoncelli,Vladimir Babin,Juan Barceló,Marjana Regvar,Charlotte Poschenrieder +12 more
TL;DR: Low-energy X-ray fluorescence spectro-microscopy (LEXRF) was used to study localization of Al and other low Z-elements in leaves of the tea plant and suggested that the retention of Al in epidermal leaf apoplast represent the main tolerance mechanism to Al in tea plants.
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Simultaneous soft X-ray transmission and emission microscopy
Alessandra Gianoncelli,Burkhard Kaulich,Roberto Alberti,T. Klatka,Angelo Longoni,A. de Marco,Alessandro Marcello,Maya Kiskinova +7 more
TL;DR: In this paper, a low-energy X-ray fluorescence (LEXRF) system based on a multiple Si drift detector (SDD) configuration has been developed and implemented in the European TwinMic Xray microspectroscopy station operating at the Italian synchrotron radiation facility ELETTRA.