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C. Holmes

Researcher at University of Bristol

Publications -  15
Citations -  1124

C. Holmes is an academic researcher from University of Bristol. The author has contributed to research in topics: Phased array & Ultrasonic sensor. The author has an hindex of 7, co-authored 15 publications receiving 899 citations.

Papers
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Post-processing of the full matrix of ultrasonic transmit-receive array data for non-destructive evaluation

TL;DR: This paper describes an alternative approach in which the full matrix of time domain signals from every transmitter–receiver pair is captured and post-processed and shown to offer significant performance advantages for NDE.
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Advanced post-processing for scanned ultrasonic arrays: Application to defect detection and classification in non-destructive evaluation

TL;DR: A number of array post-processing methods developed for scanning applications in non-destructive evaluation are described, one of which is to capture and process the full matrix of all transmit-receive time-domain signals from the array.
Journal ArticleDOI

Advanced Reflector Characterization with Ultrasonic Phased Arrays in NDE Applications

TL;DR: A technique for characterizing reflectors with subwavelength dimensions by post-processing the complete data set of time traces obtained from an ultrasonic array using two algorithms is described.
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The post-processing of ultrasonic array data using the total focusing method

TL;DR: An alternative approach in which the complete raw data set offline domain signals from every transmitter-receiver pair is collected, stored and post-processed is described, which allows novel inspections to be performed which would be impossible with single-element transducers and impractical using the traditional phased array controller methodology.

Enhanced Defect Detection and Characterisation by Signal Processing of Ultrasonic Array Data

TL;DR: In this paper, the vector TFM (VTFM) algorithm is proposed to obtain the angular reflectivity characteristics of any point in a sample, which can be used for defect sizing and classification.