C
C. Holmes
Researcher at University of Bristol
Publications - 15
Citations - 1124
C. Holmes is an academic researcher from University of Bristol. The author has contributed to research in topics: Phased array & Ultrasonic sensor. The author has an hindex of 7, co-authored 15 publications receiving 899 citations.
Papers
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Journal ArticleDOI
Post-processing of the full matrix of ultrasonic transmit-receive array data for non-destructive evaluation
TL;DR: This paper describes an alternative approach in which the full matrix of time domain signals from every transmitter–receiver pair is captured and post-processed and shown to offer significant performance advantages for NDE.
Journal ArticleDOI
Advanced post-processing for scanned ultrasonic arrays: Application to defect detection and classification in non-destructive evaluation
TL;DR: A number of array post-processing methods developed for scanning applications in non-destructive evaluation are described, one of which is to capture and process the full matrix of all transmit-receive time-domain signals from the array.
Journal ArticleDOI
Advanced Reflector Characterization with Ultrasonic Phased Arrays in NDE Applications
TL;DR: A technique for characterizing reflectors with subwavelength dimensions by post-processing the complete data set of time traces obtained from an ultrasonic array using two algorithms is described.
Journal ArticleDOI
The post-processing of ultrasonic array data using the total focusing method
TL;DR: An alternative approach in which the complete raw data set offline domain signals from every transmitter-receiver pair is collected, stored and post-processed is described, which allows novel inspections to be performed which would be impossible with single-element transducers and impractical using the traditional phased array controller methodology.
Enhanced Defect Detection and Characterisation by Signal Processing of Ultrasonic Array Data
TL;DR: In this paper, the vector TFM (VTFM) algorithm is proposed to obtain the angular reflectivity characteristics of any point in a sample, which can be used for defect sizing and classification.