C
C. P. Vlahacos
Researcher at University of Maryland, College Park
Publications - 14
Citations - 511
C. P. Vlahacos is an academic researcher from University of Maryland, College Park. The author has contributed to research in topics: Microwave & Microscope. The author has an hindex of 9, co-authored 14 publications receiving 502 citations.
Papers
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Journal ArticleDOI
Imaging of microwave permittivity, tunability, and damage recovery in (Ba, Sr)TiO3 thin films
D. E. Steinhauer,C. P. Vlahacos,F. C. Wellstood,Steven M. Anlage,C. Canedy,R. Ramesh,Andrei Stanishevsky,J. Melngailis +7 more
TL;DR: In this paper, the authors used a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film Dielectric samples on a length scale of 1 μm.
Journal ArticleDOI
Imaging of Microwave Permittivity, Tunability, and Damage Recovery in (Ba,Sr)TiO3 Thin Films
D. E. Steinhauer,C. P. Vlahacos,C. Canedy,Andrei Stanishevsky,J. Melngailis,R. Ramesh,F. C. Wellstood,Steven M. Anlage +7 more
TL;DR: In this paper, the authors used a near-field scanning microwave microscope to quantitatively image the dielectric permittivity and tunability of thin-film dielectrics on a length scale of 1 micron.
Journal ArticleDOI
Imaging microwave electric fields using a near-field scanning microwave microscope
S. K. Dutta,C. P. Vlahacos,D. E. Steinhauer,Ashfaq S. Thanawalla,B. J. Feenstra,Frederick C. Wellstood,Steven M. Anlage,Harvey S. Newman +7 more
TL;DR: In this paper, a fine open-ended coaxial probe above an operating microwave device was used to image local electric fields generated by the device at microwave frequencies, where the probe is sensitive to the electric flux normal to the face of its center conductor, allowing different components of the field to be imaged by orienting the probe appropriately.
Book ChapterDOI
Near-Field Microwave Microscopy of Materials Properties
TL;DR: In this paper, the authors review the five major types of near-field microwave microscopes and discuss their own form of microscopy in detail and present the future prospects for near field measurements of microwave electrodynamic properties.
Patent
Quantitative imaging of dielectric permittivity and tunability
TL;DR: In this article, a near-field scanning microwave microscope is used to image the permittivity and dielectric tunability of bulk and thin film dielectrics on a length scale of about 1 micron or less.