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Ch. Knedlik

Researcher at Technische Universität Ilmenau

Publications -  13
Citations -  308

Ch. Knedlik is an academic researcher from Technische Universität Ilmenau. The author has contributed to research in topics: Thin film & Cyclic voltammetry. The author has an hindex of 6, co-authored 13 publications receiving 264 citations.

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Journal ArticleDOI

Viscosity effect on GaInSn studied by XPS

TL;DR: In this article, a home-built device for low (9%) and high (95%) relative humidity for shorter (450 min) and longer (1800 min) time periods was used to measure the viscosity of GaInSn alloys.
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Nanoscale multilayer WC/C coatings developed for nanopositioning: Part I. Microstructures and mechanical properties

TL;DR: In this paper, the microstructure, composition and mechanical properties of the multilayers of the Tungsten carbide/Carbon (WC/C) were characterized.
Journal ArticleDOI

Nanoscale multilayer WC/C coatings developed for nanopositioning, part II: Friction and wear

TL;DR: In this article, a microtribometer was used to investigate the tungsten carbide/carbon (WC/C) multilayers of nanometers in period by a micro-tribometers and cross-examined with respect to the evolution of the morphology and the composition of wear scars.
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Sputtered yttrium oxide thin films appropriate for electrochemical sensors

TL;DR: In this paper, the influence of annealing on selected electrical and mechanical properties of Y 2 O 3 thin films has been studied, and it was shown that with increasing annaling temperature the values of electrical strength and electrical resistivity increase, whereas, values of relative permittivity and Young's modulus decrease.
Book ChapterDOI

Tribological characteristics of WC1-x, W2C and WC tungsten carbide films

TL;DR: In this paper, thin film coatings with dominant phases of WC1-x, W2C and WC, were prepared by magnetron sputtering and the microstructures and chemistry of the coatings were characterized by X-ray diffraction (XRD), Auger electron spectroscopy (AES), and scanning electron microscopy (SEM) equipped with EDS.