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Charles A. Evans
Researcher at University of Illinois at Urbana–Champaign
Publications - 67
Citations - 2356
Charles A. Evans is an academic researcher from University of Illinois at Urbana–Champaign. The author has contributed to research in topics: Mass spectrometry & Ion. The author has an hindex of 25, co-authored 67 publications receiving 2327 citations.
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Mechanism of the SIMS matrix effect
TL;DR: In this paper, it is argued that the matrix sputtering yield determines the near surface concentration of the ion-yield-enhancing species O and Cs, and that these ionyield variations are solely attributable to variations in the matrix Sputtering yield.
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Physical and electrical properties of laser‐annealed ion‐implanted silicon
TL;DR: In this article, the use of a laser as a tool for annealing of ion implantation damage is described, and electrical measurements show that activity comparable to that of a 1000 °C 30min anneal can be obtained.
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Electrohydrodynamic ionization mass spectrometry - the ionization of liquid glycerol and non-volatile organic solutes
TL;DR: In this paper, an analytical ion source based on this principle has been used for mass analysis of liquid metal systems, and this study describes its application to organic liquids, using glycerol as the host fluid and NaI as the electrolyte.
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Determination of the surface predominance of toxic elements in airborne particles by ion microprobe mass spectrometry and Auger electron spectrometry
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A unified explanation for secondary ion yields
TL;DR: In this paper, the pure element secondary ion yields under oxygen and cesium ion bombardment are shown to be solely dependent on a) the ionization potential (or electron affinity for negative ionization) of the sputtered atom and b) the reciprocal of the matrix sputtering yield which determines the equilibrium concentration of implanted oxygen or Cesium, and this unified approach accounts for the yields of C±, Si±, Ge± and Sn± from the pure elements as well as of Ga± and As± from gallium arsenide.