Composite lead-free solders, containing micro and nano particles, have been widely studied. Due to grain boundary drag or Zener drag, these particles can refrain the solder microstructure from coarsening in services, especially for Cu6Sn5, Ag3Sn intermetallic compounds and the β-Sn phases. Due to dispersion hardening or dislocation drag, the mechanical properties of the composite solder alloys were enhanced significantly. Moreover, these particles can influence the rate of interfacial reactions, and some particles can transform into a layer of intermetallic compound. Wettability, creep resistance, and hardness properties were affected by these particles. A systematic review of the development of these lead-free composite solders is given here, which hopefully may find applications in microbumps to be used in the future 3D IC technology.

Structure and properties of lead-free solders bearing micro and nano particles

During soldering and service, intermetallic compounds (IMCs) have an important impact on the performance and reliability of electronic products. A thin and continuous intermetallic layer facilitates the formation of reliable solder joints and improves the creep and fatigue resistance of solder joints. However, if the IMCs overgrow, the coarse IMC becomes brittle and tends to crack under stress, leading to a decrease in solder joint reliability. Based on the latest developments in the field of lead-free solders at home and abroad, this paper comprehensively reviews the interfacial reaction between SnAgCu Pb-free solders and different substrates and the growth behavior of IMCs and clarifies the growth mechanism of interfacial IMCs. The effects of the modification measures of lead-free solder on the IMCs and reliability of SnAgCu/substrate interface are analyzed, which provide a theoretical basis for the development and application of new lead-free solder.

Interface reaction and intermetallic compound growth behavior of Sn-Ag-Cu lead-free solder joints on different substrates in electronic packaging

The superior electro-thermal properties of silicon carbide (SiC) power devices permit higher temperature of operation and enable higher power density compared with silicon devices. Nevertheless, the reliability of SiC power modules has been identified as a major area of uncertainty in applications which require high reliability. Traditional power module packaging methods developed for silicon chips have been adopted for SiC and the different thermomechanical properties cause different fatigue stresses on the solder layer of the chip. In this paper, a 2-D finite element model has been developed to evaluate the stress performance and lifetime of the solder layer for Si devices, which has been validated using accelerated power cycling tests on Si IGBTs. The proposed model was extrapolated for SiC devices of the same voltage and current rating using the same solder material and the results show that under the same cyclic power loss profile the induced stress and strain energy in the die attach layer is much higher and concentrates on the die/solder interfacial area for SiC chips. Using the validated stress-based model, the lifetime can be quantified when SiC chips are used. This ability to extrapolate the available power cycling and lifetime data of silicon chips to SiC chips would be a key element for developing reliable packaging methods for SiC devices.

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Failure and Reliability Analysis of a SiC Power Module Based on Stress Comparison to a Si Device

Development of new multicomponent Sn–Ag–Cu–Bi lead-free solders for low-cost commercial electronic assembly

Effect of nano-Fe2O3 additions on wettability and interfacial intermetallic growth of low-Ag content Sn–Ag–Cu solders on Cu substrates

Development of SnAg-based lead free solders in electronics packaging

With more consumer products moving towards environmentally friendly packaging, making solder Pb-free has become an urgent task for electronics assemblies. Solder joints are responsible for both electrical and mechanical connections. Solder joint does not have adequate ductility to ensure the repeated relative displacements due to the mismatch between expansion coefficients of the chip carrier and the circuit board. Materials behavior of solder joints involves a creep–fatigue interaction, making it a poor material for mechanical connections. The reliability of solder joints of electronics components has been found playing a more important role in service for microelectronics components and micro-electro-mechanical systems. So many researchers in the world investigated reliability of solder joints based on finite element simulation and experiments about the electronics devices, such as CR, QFP, QFN, PLCC, BGA, CSP, FCBGA and CCGA, which were reviewed systematically and extensively. Synchronously the investigation on reliability of solder joints was improved further with the high-speed development of lead-free electronic packaging, especially the constitutive equations and the fatigue life prediction equations. In this paper, the application and research status of constitutive equations and fatigue life prediction equations were reviewed, which provide theoretic guide for the reliability of lead-free solder joints.

Reliability behavior of lead-free solder joints in electronic components

Finite element method and Garofalo–Arrheninus creep model were combined and used to evaluate the reliability of different lead-free solder joints (SnAgCu, SnAg, SnSb and SnZn) and SnPb solder joints in chip scale package (CSP) 14 × 14 device under thermal cyclic loading. The results show that von Mises stress and equivalent creep strain in each of the four lead-free solder joints and SnPb solder joints were strongly different, increasing in the order SnPb < SnAg < SnSb < SnZn < SnAgCu. It is found that maximum stress–strain concentrates on the top-surface of corner solder joints in the CSP device for all solder joints, and SnAgCu solder joints shows the highest fatigue life among those five kinds of solder joints.

Cheng-wen He

Papers

Development of SnAg-based lead free solders in electronics packaging

Reliability behavior of lead-free solder joints in electronic components

Reliability of lead-free solder joints in CSP device under thermal cycling

Properties enhancement of SnAgCu solders containing rare earth Yb

Anand model and FEM analysis of SnAgCuZn lead-free solder joints in wafer level chip scale packaging devices