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Chih-Hung Yen

Researcher at National Cheng Kung University

Publications -  34
Citations -  336

Chih-Hung Yen is an academic researcher from National Cheng Kung University. The author has contributed to research in topics: Light-emitting diode & Heterojunction bipolar transistor. The author has an hindex of 11, co-authored 34 publications receiving 330 citations.

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Investigation of temperature-dependent characteristics of an n/sup +/-InGaAs/n-GaAs composite doped channel HFET

TL;DR: In this article, the temperature-dependent characteristics of an n+-InGaAs/n-GaAs composite doped channel (CDC) heterostructure field effect transistor (HFET) have been studied.
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Influences of sulfur passivation on temperature-dependent characteristics of an AlGaAs/InGaAs/GaAs PHEMT

TL;DR: In this article, the influence of (NH/sub 4/)/sub 2/S/sub x/ treatment on an AlGaAs/InGaA/GaAs pseudomorphic high electron mobility transistor (PHEMT) is studied and demonstrated.
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On an AlGaInP-Based Light-Emitting Diode With an ITO Direct Ohmic Contact Structure

TL;DR: An interesting AlGaInP multiple-quantum-well light-emitting diode (LED) with a direct ohmic contact structure, formed by an indium-tinoxide (ITO) transparent film and AuBe diffused thin layer, is fabricated and studied as mentioned in this paper.
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Performance investigation of GaN-based light-emitting diodes with tiny misorientation of sapphire substrates

TL;DR: GaN-based light-emitting diodes (LEDs) grown on c-plane vicinal sapphire substrates are fabricated and characterized and the extremely enhanced output power is primarily caused by the formation of indium quantum dots in MQW which provides an increased quantum efficiency.
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Influences of surface sulfur treatments on the temperature-dependent characteristics of HBTs

TL;DR: In this article, the temperature-dependent DC characteristics of InGaP-GaAs heterojunction bipolar transistors with and without sulfur treatment are systematically studied and demonstrated, and it is shown that with the use of sulfur passivation, the series resistance of base-emitter junction of the studied device can be effectively reduced.