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Christian Rotsch

Researcher at Infineon Technologies

Publications -  28
Citations -  2204

Christian Rotsch is an academic researcher from Infineon Technologies. The author has contributed to research in topics: Photomask & Wafer. The author has an hindex of 8, co-authored 27 publications receiving 2122 citations. Previous affiliations of Christian Rotsch include Ludwig Maximilian University of Munich & Max Planck Society.

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Drug-Induced Changes of Cytoskeletal Structure and Mechanics in Fibroblasts: An Atomic Force Microscopy Study

TL;DR: The effect of various drugs affecting the integrity of different components of the cytoskeleton on the elasticity of two fibroblast cell lines was investigated by elasticity measurements with an atomic force microscope (AFM).
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Dimensional and mechanical dynamics of active and stable edges in motile fibroblasts investigated by using atomic force microscopy

TL;DR: The atomic force microscope was employed to investigate the extension and retraction dynamics of protruding and stable edges of motile 3T3 fibroblasts in culture, and data are consistent with the notion that extension preferentially occurs in regions of lower cortical tension.
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Afm imaging and elasticity measurements on living rat liver macrophages

TL;DR: The authors investigated the morphology and the elastic properties of living cultured rat liver macrophages with an atomic force microscope (AFM) and found the importance of the cytoskeleton for the mechanical properties of the cell has been investigated by measuring the cell's elasticity as a function of position.
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Investigating the Cytoskeleton of Chicken Cardiocytes with the Atomic Force Microscope

TL;DR: In the lamellipodal region investigated here in detail, the elastic moduli range from around 10 up to 200 kPa on top of stress fibers, which means that to what extent the elastic properties of this type of cell are determined by the actin network is unknown.
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Mapping Local Electrostatic Forces with the Atomic Force Microscope

TL;DR: In this paper, an atomic force microscope (AFM) was used to measure locally electrostatic interaction between the AFM's tip and a charged surface, which can be explained by the electrostatic forces between tip and sample.