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Colum M. O'Leary
Researcher at University of Oxford
Publications - 23
Citations - 344
Colum M. O'Leary is an academic researcher from University of Oxford. The author has contributed to research in topics: Ptychography & Scanning transmission electron microscopy. The author has an hindex of 5, co-authored 18 publications receiving 133 citations.
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Journal ArticleDOI
Atomic-scale microstructure of metal halide perovskite.
Mathias Uller Rothmann,Judy S. Kim,Judy S. Kim,Juliane Borchert,Kilian Lohmann,Colum M. O'Leary,Alex Sheader,Laura Clark,Henry J. Snaith,Michael B. Johnston,Peter D. Nellist,Laura M. Herz +11 more
TL;DR: An atomic crystallographic structure of formamidinium lead triiodide (FAPbI3) polycrystalline thin films obtained by low-electron-dose scanning transmission electron microscopy with advanced image processing is presented and explains why the perovskite structure can sustain significant deviations from stoichiometry and recovers remarkably well from damage.
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Phase reconstruction using fast binary 4D STEM data
Colum M. O'Leary,Christopher S. Allen,Chen Huang,Judy S. Kim,Judy S. Kim,Emanuela Liberti,Peter D. Nellist,Angus I. Kirkland,Angus I. Kirkland +8 more
TL;DR: In this paper, focused probe ptychography using binary 4D datasets obtained using scanning transmission electron microscopy (STEM) has been used for low-dose 4D imaging.
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Interstitial Boron Atoms in the Palladium Lattice of an Industrial Type of Nanocatalyst: Properties and Structural Modifications.
Tianyi Chen,Ieuan Ellis,Ieuan Ellis,Thomas J. N. Hooper,Emanuela Liberti,Lin Ye,Benedict T. W. Lo,Colum M. O'Leary,Alexandra A. Sheader,Gerardo T. Martinez,Lewys Jones,Ping-Luen Ho,Pu Zhao,James Cookson,Peter Trenton Bishop,Philip A. Chater,John V. Hanna,Peter D. Nellist,Shik Chi Edman Tsang +18 more
TL;DR: New toolsets that enables the characterization of industrial metal nanocatalysts across length scales from macro-analysis to micro-analysis are described, which gives important guidance to structure-activity relationship of the system.
Journal ArticleDOI
Contrast transfer and noise considerations in focused-probe electron ptychography.
Colum M. O'Leary,Gerardo T. Martinez,Emanuela Liberti,M. J. Humphry,Angus I. Kirkland,Angus I. Kirkland,Peter D. Nellist +6 more
TL;DR: The contrast transfer of focused-probe, non-iterative electron ptychography using the single-side-band (SSB) method is demonstrated experimentally and normalisation of the transfer function with respect to the noise level shows that the transfer window is increased while avoiding noise amplification.
Journal ArticleDOI
Single atom detection from low contrast-to-noise ratio electron microscopy images
Jarmo Fatermans,A.J. den Dekker,A.J. den Dekker,Knut Müller-Caspary,Ivan Lobato,Colum M. O'Leary,Peter D. Nellist,S. Van Aert +7 more
TL;DR: A combination of physics-based model fitting and the use of a model-order selection method is proposed, enabling one to detect single atoms with high reliability.