D
D. A. Hite
Researcher at National Institute of Standards and Technology
Publications - 33
Citations - 1475
D. A. Hite is an academic researcher from National Institute of Standards and Technology. The author has contributed to research in topics: Noise (radio) & Scanning tunneling microscope. The author has an hindex of 13, co-authored 33 publications receiving 1349 citations. Previous affiliations of D. A. Hite include Louisiana State University & IBM.
Papers
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Journal ArticleDOI
Decoherence in josephson phase qubits from junction resonators.
TL;DR: Spectroscopic data is reported that shows a level splitting characteristic of coupling between a two-state qubit and a two -level system and Rabi oscillations whose "coherence amplitude" is significantly degraded by the presence of these spurious microwave resonators.
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Observation of quantum oscillations between a Josephson phase qubit and a microscopic resonator using fast readout
Ken Cooper,Matthias Steffen,Matthias Steffen,Robert McDermott,Raymond W. Simmonds,Seongshik Oh,D. A. Hite,David P. Pappas,John M. Martinis +8 more
TL;DR: The results reveal a new aspect of the quantum behavior of Josephson junctions, and they demonstrate the means to measure two-qubit interactions in the time domain.
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Low loss superconducting titanium nitride coplanar waveguide resonators
Michael R. Vissers,Jiansong Gao,David Wisbey,D. A. Hite,Chang C. Tsuei,Antonio Corcoles,Matthias Steffen,David P. Pappas +7 more
TL;DR: In this paper, thin films of TiN were sputterdeposited onto Si and sapphire wafers with and without SiN buffer layers, and internal quality factor measurements were taken at millikelvin temperatures in both the many photon and single photon limits, respectively.
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100-fold reduction of electric-field noise in an ion trap cleaned with in situ argon-ion-beam bombardment.
D. A. Hite,Yves Colombe,Andrew C. Wilson,Kenneth R Brown,U. Warring,Robert Jördens,John D. Jost,Kyle S. McKay,David P. Pappas,D. Leibfried,David J. Wineland +10 more
TL;DR: This study investigates the role of adsorbates on the electrodes by identifying contaminant overlayers, implementing an in situ argon-ion-beam cleaning treatment, and measuring ion heating rates before and after treating the trap electrodes' surfaces, finding a 100-fold reduction in heating rate after treatment.
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Conducting atomic force microscopy for nanoscale tunnel barrier characterization
Kristine Lang,D. A. Hite,Raymond W. Simmonds,Robert McDermott,David P. Pappas,John M. Martinis +5 more
TL;DR: In this article, an atomic force microscopy (CAFM) characterization of aluminum oxide (AlOx) barriers to be used in Josephson-junction qubits is presented, with a particular emphasis on developing reproducible imaging conditions and appropriate interpretation.