Daisuke Yamakawa

TL;DR: In this paper, an in situ technique that corrects for wavefront aberrations and allows X-rays to be focused to a spot just 7 nm wide could provide a solution.

TL;DR: A large total-reflection mirror for focusing x-ray free-electron laser beams to nanometer dimensions is presented and a figure accuracy with a peak-to-valley height of 2 nm was achieved across the entire area.

TL;DR: In this paper, the authors developed an ultra-precise measurement instrumentation for tangentially long X-ray mirrors using a Fizeau interferometer, where the mirror figure is measured by stitching the subaperture profiles measured by the relative-angle determinable stitching interferometry, which was developed previously.

TL;DR: In this article, a bendable adaptive optical system that can be used in the hard X-ray region was developed to achieve highly precise control of the wavefront shape, and demonstrated the controllability of a wavefront of a 15 nm hard Xray nanobeam.

TL;DR: In this article, a phase compensator for wavefront control of X-rays is presented, which is a 150 mm-long reflection mirror, the shape of which can be curved by adjusting the bias voltages of 36 piezoelectric plates attached to the mirror.