D
Daniel Louër
Researcher at University of Rennes
Publications - 152
Citations - 6855
Daniel Louër is an academic researcher from University of Rennes. The author has contributed to research in topics: Powder diffraction & Crystal structure. The author has an hindex of 30, co-authored 152 publications receiving 6372 citations.
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Rietveld refinement guidelines
TL;DR: A set of general guidelines for structure refinement using the Rietveld (whole profile) method has been formulated by the International Union of Crystallography Commission on Powder Diffraction.
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Powder pattern indexing with the dichotomy method
Ali Boultif,Daniel Louër +1 more
TL;DR: In this article, the DICVOL04 algorithm was extended to include a tolerance to the presence of impurity (or inaccurately measured) diffraction lines, a refinement of the zero-point position, a reviewing of all input lines from the solution found from, generally, the first 20 lines, and a cell analysis, based on the concept of the reduced cell, to identify equivalent monoclinic and triclinic solutions.
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Size–strain line-broadening analysis of the ceria round-robin sample
Davor Balzar,Davor Balzar,N. Audebrand,Mark R. Daymond,Andrew N. Fitch,A.W. Hewat,J. I. Langford,A. Le Bail,Daniel Louër,O. Masson,C.N. McCowan,N. C. Popa,Peter W. Stephens,Brian H. Toby +13 more
TL;DR: The results of both a line-broadening study on a ceria sample and a size-strain round robin on diffraction line broadening methods, which was sponsored by the Commission on Powder Diffraction of the International Union of Crystallography, are presented in this paper.
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Effect of a crystallite size distribution on X‐ray diffraction line profiles and whole‐powder‐pattern fitting
TL;DR: In this article, a powder pattern can be simulated for a given distribution of sizes, if it is assumed that on average the crystallites have a regular shape, and this can then be compared with experimental data to give refined parameters defining the distribution.
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JCPDS--International Centre for Diffraction Data round robin study of silver behenate. A possible low-angle X-ray diffraction calibration standard
Thomas N. Blanton,T. C. Huang,Hideo Toraya,Camden R. Hubbard,S. B. Robie,Daniel Louër,H. Göbel,Georg Will,Ralph Gilles,T. Raftery +9 more
TL;DR: In this article, a task group of the JCPDS-International Center for Diffraction Data (ICDD) was established with the charge of investigating the use of silver behenate, CH 3 (CH 2 ) 20 COO·Ag, as a possible low-angle calibration standard for powder diffraction applications.