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David A. Anderson

Researcher at University of Michigan

Publications -  63
Citations -  2312

David A. Anderson is an academic researcher from University of Michigan. The author has contributed to research in topics: Rydberg atom & Electric field. The author has an hindex of 22, co-authored 63 publications receiving 1700 citations.

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Broadband Rydberg Atom-Based Electric-Field Probe for SI-Traceable, Self-Calibrated Measurements

TL;DR: In this article, the authors proposed an approach for the measurement of electric fields based on the interaction of radio frequency (RF) fields with alkali atoms excited to Rydberg states via the Autler-Townes effect and detect the splitting via electromagnetically induced transparency.
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Sub-wavelength imaging and field mapping via electromagnetically induced transparency and Autler-Townes splitting in Rydberg atoms

TL;DR: In this paper, the authors used Rydberg states of rubidium atoms to probe the RF field and detect the splitting via electromagnetically induced transparency (EIT) spectroscopy.
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Electric field metrology for SI traceability: Systematic measurement uncertainties in electromagnetically induced transparency in atomic vapor

TL;DR: In this paper, the relationship between the Rabi frequency (ΩRF) related to the applied electric field and Autler-Townes (AT) splitting, when performing atom-based radiofrequency (RF) electric (E) field strength measurements using Rydberg states and electromagnetically induced transparency (EIT) in an atomic vapor, was investigated.
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Broadband Rydberg Atom-Based Electric-Field Probe: From Self-Calibrated Measurements to Sub-Wavelength Imaging

TL;DR: In this paper, a broadband, direct SI-traceable, compact, self-calibrating E-field probe (sensor) was proposed based on the interaction of radio frequency (RF) fields with alkali atoms excited to Rydberg states.
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Optical Measurements of Strong Microwave Fields with Rydberg Atoms in a Vapor Cell

TL;DR: In this article, the authors extend quantum sensing via cold atoms and electromagnetically induced transparency to the strong-field regime, which is an essential step toward calibration-free rf electric field sensors for a wide range of applications that include antenna calibration, metamaterial characterization, and subwavelength imaging.