D
David G. Bucknall
Researcher at Georgia Institute of Technology
Publications - 147
Citations - 3894
David G. Bucknall is an academic researcher from Georgia Institute of Technology. The author has contributed to research in topics: Polymer & Neutron reflectometry. The author has an hindex of 32, co-authored 143 publications receiving 3593 citations. Previous affiliations of David G. Bucknall include City University of Hong Kong & Imperial College London.
Papers
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Journal ArticleDOI
Recent advances in the study of chemical surfaces and interfaces by specular neutron reflection
Jeffrey Penfold,Robert M. Richardson,A. Zarbakhsh,J.R.P. Webster,David G. Bucknall,A. R. Rennie,Richard A. L. Jones,Terence Cosgrove,Robert Thomas,JS Higgins,P. D. I. Fletcher,E. Dickinson,Stephen J. Roser,I. A. McLure,A. R. Hillman,R. W. Richards,E. J. Staples,A. N. Burgess,E. A. Simister,J. W. White +19 more
TL;DR: The use of specular neutron reflection to study a wide variety of problems in surface and interfacial chemistry is introduced and discussed in this paper, where the design of the SURF reflectometer has been optimised for the surface chemistry of soft matter and new experimental results that exploit the novel features of this second generation neutron reflectometer are presented.
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Detonation Nanodiamond and Onion-Like-Carbon- Embedded Polyaniline for Supercapacitors
TL;DR: In this paper, the application of nanodiamond (ND) can greatly increase the performance of electrochemically active polymers, such as polyaniline (PANI), in a symmetric two-electrode confi guration with 1 M H 2 SO 4 electrolyte.
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Amplified optical nonlinearity in a self-assembled double-strand conjugated porphyrin polymer ladder.
TL;DR: Both the real and imaginary parts of the third-order susceptibility per macrocycle are amplified by ladder formation, as revealed by degenerate four-wave mixing measurements at 1064 nm.
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Chain End Effects and Dewetting in Thin Polymer Films
TL;DR: In this article, the dewetting of thin films of end-functionalized polymers, ω- and α,ω-barium sulfonato polystyrenes, on a silicon substrate has been investigated as a function of initial film thickness.
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Interfacial instability driven by dispersive forces : the early stages of spinodal dewetting of a thin polymer film on a polymer substrate
Michele Sferrazza,M. Heppenstall-Butler,Robert Cubitt,David G. Bucknall,J.R.P. Webster,Richard A. L. Jones +5 more
TL;DR: In this paper, the authors used specular and off-specular neutron reflection measurements to characterize the length scale and growth rate of the instability of the buried, polystyrene interfaces.