The invention is embodied in a gigabit Ethernet adapter. A system according to the invention provides a compact hardware solution to handling high network communication speeds. In addition, the invention adapts to multiple communication protocols via a modular construction and design.

Gigabit ethernet adapter supporting the iscsi and ipsec protocols

Techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input/output pins, the techniques and systems enable the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.

Hardware debugging in a hardware description language

A single-chip microcomputer comprising: a first bus having a central processing unit and a cache memory connected therewith; a second bus having a dynamic memory access control circuit and an external bus interface connected therewith; a break controller for connecting the first bus and the second bus selectively; a third bus having a peripheral module connected therewith and having a lower-speed bus cycle than the bus cycles of the first and second buses; and a bus state controller for effecting a data transfer and a synchronization between the second bus and the third bus. The single-chip microcomputer has the three divided internal buses to reduce the load capacity upon the signal transmission paths so that the signal transmission can be accomplished at a high speed. Moreover, the peripheral module required to have no operation speed is isolated so that the power dissipation can be reduced.

Single-chip microcomputer

An apparatus and method for dynamically adjusting the power/performance characteristics of a memory subsystem. Since the memory subsystem access requirements are heavily dependent on the application being executed, static methods of enabling or disabling the individual memory system components (as are used in prior art) are less than optimal from a power consumption perspective. By dynamically tracking the behavior of the memory subsystem, the invention predicts the probability that the next event will have certain characteristics, such as whether it will result in a memory cycle that requires the attention of a cache memory, whether that memory cycle will result in a cache memory hit, and whether a DRAM page hit in main memory will occur if the requested data is not in one of the levels of cache memory. Based on these probabilities, the invention dynamically enables or disables components of the subsystem. By intelligently adjusting the state of these components, significant power savings are achieved without degradation in performance.

Method and apparatus for dynamically adjusting power/performance characteristics of a memory subsystem

CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible to the end-user. CASP consists of two ideas: 1. Storage of very thorough test patterns in non-volatile memory; and, 2. Architectural and system-level support for autonomous testing of one or more cores in a multi-core system using stored patterns, concurrently with normal system operation, without bringing down the entire system. CASP enables design of robust systems with built-in features for circuit failure prediction, error detection, self-diagnosis and self-repair. Such systems are necessary to overcome major reliability challenges in scaled-CMOS technologies. Implementation of CASP in the OpenSPARC T1 multi-core processor demonstrates its effectiveness and practicality.

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CASP: concurrent autonomous chip self-test using stored test patterns

Verification of external interfaces of cores on system-on-chip (SOC) designs frequently entails the purchase of costly standardized software models to test the external interfaces. Typically, the standardized models provide more functionality than is needed. Instead of standardized models, test models may be developed and utilized, but this also incurs cost and delay. The present invention provides an efficient and economical alternative. A mirror interface, or copy of the external interface undergoing verification, is used with a standardized control mechanism to verify the external interface. Because all interface I/O connections can thereby be utilized, a cost-effective and highly reusable way of verifying such interfaces is provided.

Method and system for logic verification using mirror interface

At-speed test of integrated circuits is becoming critical to detect subtle delay defects. Existing structural at-speed test methods are inadequate because they are unable to supply sufficiently-varied functional clock sequences to test complex sequential logic. Moreover, they require tight restrictions on the circuit design. In this paper, we present a new method for at-speed structural test of ASICs, having no tight restrictions on the circuit design. In the present implementation, any complex at-speed functional clock waveform for 16 cycles can be applied. We present DFT structures that can generate high-speed launch-off-capture as well as launch-off-scan clocking without the need to switch a scan enable at-speed. We also describe a method to test asynchronous clock domains simultaneously. Experimental results on fault coverage and hardware measurements for three multi-million gate ASICs demonstrate the feasibility of the proposed approach.

At-Speed Structural Test For High-Performance ASICs

A method for using verification software for testing a system-on-chip (SOC) design including an embedded processor. The verification software is used to generate and apply test cases to stimulate the SOC design in simulation; the results are observed and used to de-bug the design. Verification of a SOC design which includes an embedded processor is typically very slow. To provide for a speed-up mode of verification in such a case, in the method of the present invention, verification software is partitioned into higher-level control code and lower-level device driver code. The higher-level code performs such functions as decision-making, test initialization, test randomization, multi-tasking, and comparison of test results with expected results. The low-level code interfaces with a core being simulated, to apply the test case generated by the upper-level code on a hardware level of operations. The partitioning of the verification software as described above allows for a “split-domain” mode of verification in which only the low-level code is executed by a simulated processor model, while the rest of the code executes externally to the simulator. Because most of the verification software executes externally to the simulator while only the low-level code executes on the simulated processor, the overhead of performing the high-level functions is removed from the simulator. As a result, faster verification is enabled.

Method for efficient verification of system-on-chip integrated circuit designs including an embedded processor

A method for developing re-usable software for the efficient verification of system-on-chip (SOC) integrated circuit designs. The verification software is used to generate and apply test cases to stimulate components of a SOC design (“cores”) in simulation; the results are observed and used to de-bug the design. The software is hierarchical, implementing a partition between upper-level test application code which generates test cases and verifies results, and low-level device driver code which interfaces with a core being simulated, to apply the test case generated by the upper-level code on a hardware level of operations. Test application and supporting low-level device driver pairs are used and re-used to test their corresponding component cores throughout the SOC development process, by creating higher-level test control programs which control selected combinations of the already-developed test application and device driver programs to test combinations of SOC components. The method provides for the efficient verification of SOC designs and, consequently, a reduced time-to-market for SOC products, because as the verification software is developed and stored, it becomes possible to test increasingly complex core combinations by creating relatively few high-level test programs which re-use already-existing lower-level software. Ultimately, the task of verifying a complex SOC design may be simplified to developing a single chip-specific test program which selects from already-existing test application, device driver and test control programs to perform a realistic test of a chip-specific combination of cores.

Method of developing re-usable software for efficient verification of system-on-chip integrated circuit designs

A system and method for verifying an integrated circuit design is provided. The system comprising: an I/O controller connected to one or more I/O cores, the I/O cores part of the integrated circuit design; an external memory mapped test device having a switch for selectively connecting one or more of the I/O cores to corresponding I/O driver models; a bus for transferring signals between the I/O controller and the switch; and a test operating system for controlling the switch.

David W. Milton

Papers

Method and system for logic verification using mirror interface

At-Speed Structural Test For High-Performance ASICs

Method for efficient verification of system-on-chip integrated circuit designs including an embedded processor

Method of developing re-usable software for efficient verification of system-on-chip integrated circuit designs

Method of switching external models in an automated system-on-chip integrated circuit design verification system