D
Deepak Kumar Panda
Researcher at National Institute of Technology, Silchar
Publications - 61
Citations - 356
Deepak Kumar Panda is an academic researcher from National Institute of Technology, Silchar. The author has contributed to research in topics: High-electron-mobility transistor & Transistor. The author has an hindex of 6, co-authored 32 publications receiving 103 citations. Previous affiliations of Deepak Kumar Panda include VIT University & Maruti Suzuki.
Papers
More filters
Journal ArticleDOI
The dawn of Ga2O3 HEMTs for high power electronics - A review
Rajan Singh,Trupti Ranjan Lenka,Deepak Kumar Panda,Ravi Teja Velpula,Barsha Jain,Ha Quoc Thang Bui,Hieu Pham Trung Nguyen +6 more
TL;DR: In this article, a perspective of Ga2O3 material towards making high electron mobility transistors (HEMTs) for a certain class of RF applications is given, where various defects in WBG devices and their effects on the reliability aspects are also addressed.
Journal ArticleDOI
Analysis on effect of lateral straggle on analog, high frequency and DC parameters in Ge‐source DMDG TFET
Journal ArticleDOI
Modeling and simulation of enhancement mode p-GaN Gate AlGaN/GaN HEMT for RF circuit switch applications
TL;DR: An enhancement mode p-GaN gate AlGaN/GaN HEMT is proposed and a physics based virtual source charge model with Landauer approach for electron transport has been developed using Verilog-A and simulated using Cadence Spectre, in order to predict device characteristics such as threshold voltage, drain current and gate capacitance as mentioned in this paper.
Journal ArticleDOI
Simulation Study of Dielectric Modulated Dual Material Gate TFET Based Biosensor by Considering Ambipolar Conduction
TL;DR: In this paper, a dielectric modulated dual material gate TFET (DM-DMG_TFET) based biosensor is proposed, which can effectively reduce the ambipolar current by enhancing the barrier width at channel-Drain junction.
Journal ArticleDOI
Microwave frequency small‐signal equivalent circuit parameter extraction for AlInN/GaN MOSHEMT
TL;DR: In this paper, the authors presented an accurate and efficient extraction procedure for microwave frequency small-signal equivalent circuit parameters of AlInN/GaN metal-oxide-semiconductor high electron mobility transistor (MOSHEMT).