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Dennis Achton Nielsen

Researcher at Aalborg University

Publications -  7
Citations -  64

Dennis Achton Nielsen is an academic researcher from Aalborg University. The author has contributed to research in topics: Kelvin probe force microscope & Film capacitor. The author has an hindex of 3, co-authored 7 publications receiving 44 citations.

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Journal ArticleDOI

Degradation testing and failure analysis of DC film capacitors under high humidity conditions

TL;DR: This paper investigates the degradation of a type of plastic-boxed metallized DC film capacitors under different humidity conditions based on a total of 8700 h of accelerated testing and also postfailure analysis, to enable a better understanding of the humidity-related failure mechanisms and reliability performance of DCFilm capacitors for power electronics applications.
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Wire bond degradation under thermo- and pure mechanical loading

TL;DR: A large number of bond interfaces are analyzed and they are found to follow conventional accepted fracture laws like Paris-Erdogan, which could enable the possibility of obtaining empirical parameters to be used in actual physics based lifetime laws.
Journal ArticleDOI

Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces

TL;DR: In this article, a model that allows prediction of the surface potential on a metal/polymer heterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement is presented.
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The Physical Properties and Self-Assembly Potential of the RFFFR Peptide.

TL;DR: It is experimentally verified that the designer peptide RFFFR forms fibers that are entangled and form solid spheres without water inside, and the dissolution properties of the spheres further suggest that they might be used as drug‐delivery systems.
Proceedings ArticleDOI

Electric field mapping inside metallized film capacitors

TL;DR: In this article, the authors used Kelvin probe force microscopy (KPFM) to analyze metallized film capacitors with the purpose of determining the degradation mechanism(s) they suffered from accelerated testing.