D
Dennis Achton Nielsen
Researcher at Aalborg University
Publications - 7
Citations - 64
Dennis Achton Nielsen is an academic researcher from Aalborg University. The author has contributed to research in topics: Kelvin probe force microscope & Film capacitor. The author has an hindex of 3, co-authored 7 publications receiving 44 citations.
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Journal ArticleDOI
Degradation testing and failure analysis of DC film capacitors under high humidity conditions
TL;DR: This paper investigates the degradation of a type of plastic-boxed metallized DC film capacitors under different humidity conditions based on a total of 8700 h of accelerated testing and also postfailure analysis, to enable a better understanding of the humidity-related failure mechanisms and reliability performance of DCFilm capacitors for power electronics applications.
Journal ArticleDOI
Wire bond degradation under thermo- and pure mechanical loading
Kristian Bonderup Pedersen,Dennis Achton Nielsen,Bernhard Czerny,Golta Khatibi,Francesco Iannuzzo,Vladimir Popok,Kjeld Møller Pedersen +6 more
TL;DR: A large number of bond interfaces are analyzed and they are found to follow conventional accepted fracture laws like Paris-Erdogan, which could enable the possibility of obtaining empirical parameters to be used in actual physics based lifetime laws.
Journal ArticleDOI
Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces
TL;DR: In this article, a model that allows prediction of the surface potential on a metal/polymer heterostructure as measured by Kelvin probe force microscopy by including the tip-induced polarization of the dielectric that arises during measurement is presented.
Journal ArticleDOI
The Physical Properties and Self-Assembly Potential of the RFFFR Peptide.
TL;DR: It is experimentally verified that the designer peptide RFFFR forms fibers that are entangled and form solid spheres without water inside, and the dissolution properties of the spheres further suggest that they might be used as drug‐delivery systems.
Proceedings ArticleDOI
Electric field mapping inside metallized film capacitors
TL;DR: In this article, the authors used Kelvin probe force microscopy (KPFM) to analyze metallized film capacitors with the purpose of determining the degradation mechanism(s) they suffered from accelerated testing.