D
Din Ping Tsai
Researcher at Hong Kong Polytechnic University
Publications - 572
Citations - 22884
Din Ping Tsai is an academic researcher from Hong Kong Polytechnic University. The author has contributed to research in topics: Metamaterial & Plasmon. The author has an hindex of 65, co-authored 532 publications receiving 18101 citations. Previous affiliations of Din Ping Tsai include University of Toronto & Industrial Technology Research Institute.
Papers
More filters
Journal ArticleDOI
Demonstrating Applications of Non-optically Regulated Tapping-Mode Near-Field Scanning Optical Microscopy to Nano-optical Metrology and Optical Characterization of Semiconductors
Nien Hua Lu,Nien Hua Lu,Shuen De Chang,Shuen De Chang,Guan−Bin Huang,Hung Ji Huang,Ying-Sheng Huang,Hai-Pang Chiang,Hai-Pang Chiang,Din Ping Tsai +9 more
TL;DR: In this article, a short-probe tapping-mode tuning fork (TMTF) configuration is used for near-field scanning optical microscopy (NSOM) in which a cleaved short fiber probe attached to one tine of the tuning fork is used as a light collector/emitter as well as a force-sensing element.
Journal ArticleDOI
Study of optical fibre structures by Atomic Force Microscopy
Din Ping Tsai,Yueh Liang Chung +1 more
TL;DR: In this paper, the doping concentration profiles of fibres revealed by differential etching speeds in a saturated solution of ammonium bifluoride at room temperature (25°C) were obtained from AFM topographic images.
Journal Article
Near- and far-field optical properties of embedded scatters in AgO x-type super-resolution near-field structures
TL;DR: The two-dimensional finite-difference time-domain (FDTD) method is used to study the near-field and far-field properties of different types of embedded scatters in the AgOx-type super-RENS.
Proceedings ArticleDOI
Ultrahigh-density optical recording using a scanning near-field optical microscope
TL;DR: In this article, a near-field scanning optical microscope (NSOM) system with a bent or a straight optical fiber probe was successfully developed to perform optical recording on the surface of cyanine (C35H35CIN2-O4) dye layer or Ge21Te26Sb53 phase change (PC) thin film.
Patent
Image-based diopter measuring system
TL;DR: In this paper, an image-based diopter measuring system consisting of an optical device and an electronic device is presented, where the optical device is used to guide an external light which is passed through an analyte.