D
Din Ping Tsai
Researcher at Hong Kong Polytechnic University
Publications - 572
Citations - 22884
Din Ping Tsai is an academic researcher from Hong Kong Polytechnic University. The author has contributed to research in topics: Metamaterial & Plasmon. The author has an hindex of 65, co-authored 532 publications receiving 18101 citations. Previous affiliations of Din Ping Tsai include University of Toronto & Industrial Technology Research Institute.
Papers
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Quasi-coherent thermal radiation with multiple resonant plasmonic cavities
Chun Yen Liao,Chih Ming Wang,Bo Han Cheng,Yi-Hao Chen,Wei Yi Tsai,De Yu Feng,Ting Tso Yeh,Ta-Jen Yen,Din Ping Tsai,Din Ping Tsai +9 more
TL;DR: In this paper, a 1D plasmonic multilayer structure was proposed as a high-contrast mid-infrared thermal emitter with three distinct resonant wavelengths.
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Plasmonic anapole metamaterial for refractive index sensing
TL;DR: In this paper , a plasmonic anapole metamaterial sensor of environmental refractive index in the optical part of the spectrum has been demonstrated and the sensor exhibits high sensitivity to the ambient refractive indices at the level of 330 nm/RIU.
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Near-Infrared-Activated Fluorescence Resonance Energy Transfer-Based Nanocomposite to Sense MMP2-Overexpressing Oral Cancer Cells
Yung-Chieh Chan,Ming-Hsien Chan,Chieh-Wei Chen,Ru-Shi Liu,Ru-Shi Liu,Ru-Shi Liu,Michael Hsiao,Din Ping Tsai +7 more
TL;DR: This research presents a novel probabilistic approach to estimating the response of the immune system to laser-spot assisted, 3D image recognition.
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Plasmonic Infrared Bandstop Reflective Filter
Chih Ming Wang,Din Ping Tsai +1 more
TL;DR: In this article, a plasmonic multilayer structure was modified to an asymmetric one and a nanoporous Au film was proposed to act as a bandstop filter.
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Indium nitride epilayer prepared by UHV-plasma-assisted metalorganic molecule beam epitaxy
TL;DR: In this article, the influence of substrate temperature on film crystallinity, surface morphology, optical, and electrical properties was studied using x-ray diffraction (XRD), transmission electron microscopy (TEM), field emission scanning electron microscope (FE-SEM), UV/VIS/NIR spectrophotometer, and Hall measurement.