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Dinesh K. Sood

Researcher at RMIT University

Publications -  89
Citations -  925

Dinesh K. Sood is an academic researcher from RMIT University. The author has contributed to research in topics: Ion implantation & Silicon. The author has an hindex of 17, co-authored 89 publications receiving 902 citations. Previous affiliations of Dinesh K. Sood include University of Arkansas.

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Patterning, electroplating and removal of SU-8 moulds by excimer laser micromachining

TL;DR: In this paper, the ablation characteristics of the SU-8 photoresist under 248 KrF excimer pulsed laser radiation have been studied and the variation of etch rate with fluence has been investigated in the range 005-301 J cm-2.
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Selective growth of silica nanowires in silicon catalysed by Pt thin film

TL;DR: The selectivity to the Pt thickness has been exploited to create regions of nanowires connected to conducting silicide simultaneously in a single furnace treatment, opening the gateways for realizing hybrid interconnects in silicon for various nano-optical applications such as the localization of light, low-dimensional waveguides for functional microphotonics, scanning near-field microscopy, and nanoantennae.
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Ion implantation based selective synthesis of silica nanowires on silicon wafers

TL;DR: In this article, a new method for selective growth of silica nanowires on silicon wafers is demonstrated by using ion implantation through a mask, where Pd ions are implanted into Si (100) to form nanoclusters of Pd.
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Mercury diffusion in gold and silver thin film electrodes on quartz crystal microbalance sensors

TL;DR: In this paper, the diffusion behavior of mercury into both gold and silver electrodes of polished and roughened quartz crystal microbalances (QCMs) is presented, where several QCM devices were exposed to mercury vapor for 8h and allowed to desorb for 5h under controlled nitrogen atmosphere.
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Young's modulus measurements of silicon nanostructures using a scanning probe system: a non-destructive evaluation approach

TL;DR: In this article, a scanning probe system in the form of an atomic force microscope was used to measure their mechanical properties in a non-destructive evaluation approach, and the Young's modulus remained unchanged from the bulk value: 179 GPa.